SPECTRAL INTERFEROMETRY IN THICKNESS MEASUREMENTS OF OPTICALLY TRANSPARENT LAYERED STRUCTURES

2017 ◽  
Vol 76 (13) ◽  
pp. 1181-1192
Author(s):  
K. A. Lukin ◽  
D. N. Tatyanko ◽  
A. B. Pikh ◽  
O. V. Zemlyanyi
Keyword(s):  
Layered Structures ◽  
Spectral Interferometry ◽  
Optically Transparent ◽  
Thickness Measurements

Dislocations, Ordering and Antiferromagnetic Domains in MnO

1970 ◽  
Vol 28 ◽  
pp. 522-523
Author(s):  
D. J. Barber ◽  
R. G. Evans
Keyword(s):  
Electron Diffraction ◽  
Single Crystal ◽  
Optical Microscopy ◽  
Defect Chemistry ◽  
Magnetic Structures ◽  
Optically Transparent ◽  
Magnetic Features ◽  
Antiferromagnetic Domains

Manganese (II) oxide, MnO, in common with CoO, NiO and FeO, possesses the NaCl structure and shows antiferromagnetism below its Neel point, Tn∼ 122 K. However, the defect chemistry of the four oxides is different and the magnetic structures are not identical. The non-stoichiometry in MnO2 small (∼2%) and below the Tn the spins lie in (111) planes. Previous work reported observations of magnetic features in CoO and NiO. The aim of our work was to find explanations for certain resonance results on antiferromagnetic MnO.Foils of single crystal MnO were prepared from shaped discs by dissolution in a mixture of HCl and HNO3. Optical microscopy revealed that the etch-pitted foils contained cruciform-shaped precipitates, often thick and proud of the surface but red-colored when optically transparent (MnO is green). Electron diffraction and probe microanalysis indicated that the precipitates were Mn2O3, in contrast with recent findings of Co3O4 in CoO.

Analysis of electroless nickel thin films

1991 ◽  
Vol 49 ◽  
pp. 510-511 ◽  
Author(s):  
C. W. Price ◽  
E. F. Lindsey
Keyword(s):  
Thin Films ◽  
Inertial Confinement Fusion ◽  
Electroless Nickel ◽  
Inertial Confinement ◽  
Plating Bath ◽  
X Ray ◽  
Nickel Thin Films ◽  
Nickel Deposits ◽  
Confinement Fusion ◽  
Thickness Measurements

Thickness measurements of thin films are performed by both energy-dispersive x-ray spectroscopy (EDS) and x-ray fluorescence (XRF). XRF can measure thicker films than EDS, and XRF measurements also have somewhat greater precision than EDS measurements. However, small components with curved or irregular shapes that are used for various applications in the the Inertial Confinement Fusion program at LLNL present geometrical problems that are not conducive to XRF analyses but may have only a minimal effect on EDS analyses. This work describes the development of an EDS technique to measure the thickness of electroless nickel deposits on gold substrates. Although elaborate correction techniques have been developed for thin-film measurements by x-ray analysis, the thickness of electroless nickel films can be dependent on the plating bath used. Therefore, standard calibration curves were established by correlating EDS data with thickness measurements that were obtained by contact profilometry.

Effect of high pressure-temperature on silicon layered structures as determined by X-ray diffraction and electron microscopy

2004 ◽  
Vol 27 (1-3) ◽  
pp. 415-418
Author(s):  
J. Bak-Misiuk ◽  
A. Misiuk ◽  
J. Ratajczak ◽  
A. Shalimov ◽  
I. Antonova ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
High Pressure ◽  
Layered Structures ◽  
X Ray Diffraction ◽  
X Ray

X-RAY STUDIES RELATED TO COATING THICKNESS MEASUREMENTS

1984 ◽  
Vol 45 (C2) ◽  
pp. C2-33-C2-36 ◽  
Author(s):  
D. A. Sewell ◽  
I. D. Hall ◽  
G. Love ◽  
J. P. Partridge ◽  
V. D. Scott
Keyword(s):  
Coating Thickness ◽  
X Ray ◽  
Thickness Measurements

Zirconia thickness measurements for irradiated fuel rods: an approach to better understanding measurement error

2011 ◽  
pp. 107-114
Author(s):  
B. Lacroix ◽  
T. Martella ◽  
M. Pras ◽  
M. Masson-Fauchier ◽  
L. Fayette
Keyword(s):  
Measurement Error ◽  
Fuel Rods ◽  
Thickness Measurements ◽  
Irradiated Fuel

Influence of magnetic field to the allocation of imputiry molecules in the structure of optically transparent polymer films

2016 ◽  
Vol 38 (3) ◽  
pp. 205-210
Author(s):  
L.A. Bulavin ◽  
◽  
Yu.F. Zabashta ◽  
О.О. Brovko ◽  
L.Yu. Vergun ◽  
...  
Keyword(s):  
Magnetic Field ◽  
Polymer Films ◽  
Optically Transparent

OPTICAL REFLECTOMETER BASED ON THE METHOD OF SPECTRAL INTERFEROMETRY

2016 ◽  
Vol 75 (1) ◽  
pp. 59-70 ◽  
Author(s):  
K. A. Lukin ◽  
D. N. Tatyanko ◽  
Yu. A. Shiyan ◽  
L. V. Yurchenko ◽  
A.V. Bazakutsa
Keyword(s):  
Spectral Interferometry ◽  
Optical Reflectometer
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