Semi-supervised meta-learning networks with squeeze-and-excitation attention for few-shot fault diagnosis
2020 ◽
Vol 1510
◽
pp. 012026
2022 ◽
Vol 169
◽
pp. 108765
Keyword(s):
Keyword(s):
Metric-based meta-learning model for few-shot fault diagnosis under multiple limited data conditions
2021 ◽
Vol 155
◽
pp. 107510