Topographic study of dislocation structure in hexagonal SiC single crystals with low dislocation density

2007 ◽  
Vol 304 (1) ◽  
pp. 57-63 ◽  
Author(s):  
Daisuke Nakamura ◽  
Satoshi Yamaguchi ◽  
Itaru Gunjishima ◽  
Yoshiharu Hirose ◽  
Tsunenobu Kimoto
1989 ◽  
Author(s):  
M. Tatsumi ◽  
T. Kawase ◽  
T. Araki ◽  
N. Yamabayashi ◽  
T. Iwasaki ◽  
...  

2009 ◽  
Vol 311 (10) ◽  
pp. 3019-3024 ◽  
Author(s):  
Fumio Kawamura ◽  
Masaki Tanpo ◽  
Naoya Miyoshi ◽  
Mamoru Imade ◽  
Masashi Yoshimura ◽  
...  

1978 ◽  
Vol 17 (4) ◽  
pp. 611-616 ◽  
Author(s):  
Yasuhiko Deguchi ◽  
Nobuo Kamigaki ◽  
Kenji Kashiwaya ◽  
Takao Kino

2002 ◽  
Vol 237-239 ◽  
pp. 367-372 ◽  
Author(s):  
K. Mizuno ◽  
S. Yamamoto ◽  
H. Okamoto ◽  
M. Kuga ◽  
E. Hashimoto

2007 ◽  
Vol 345-346 ◽  
pp. 29-32
Author(s):  
Sei Miura ◽  
Yoshito Nishimura ◽  
Nagato Ono

The effect of sub-grain on the yield stress of pure copper single crystals with the [253] orientation was investigated by using the etch pit technique. The single crystal plates were successfully prepared from the seed crystals, which were produced at the melting temperature of 1473 K by the Bridgeman method. The present investigation confirmed the Hall-Petch relation concerning the effect of sub-grain boundaries on the macroscopic yielding of pure copper. The result derived from the extrapolation of the relationship of critical resolved shear stress (CRSS) and the initial dislocation density and sub-grain size is in good agreement with the evaluation in high purity copper single crystals of low dislocation density.


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