Vertical Bridgman growth and characterization of CdMnTe crystals for gamma-ray radiation detector

2011 ◽  
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pp. 1062-1066 ◽  
Author(s):  
Yuanyuan Du ◽  
Wanqi Jie ◽  
Tao Wang ◽  
Yadong Xu ◽  
Liying Yin ◽  
...  
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Shixing Xia ◽  
Meng Wang ◽  
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Zuotao Lei ◽  
Guoli Zhu ◽  
...  

Author(s):  
Vasylyna Kopach ◽  
Oleh Kopach ◽  
Larysa Shcherbak ◽  
Petro Fochuk ◽  
Aleksey E. Bolotnikov ◽  
...  

1993 ◽  
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Don Di Marzio ◽  
M.B. Lee ◽  
David J. Larson ◽  
Michael Dudley ◽  
...  

2008 ◽  
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Jijun Zhang ◽  
Wanqi Jie ◽  
Tao Wang ◽  
Dongmei Zeng ◽  
Yunxiao Hao ◽  
...  

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H.-J. Schwarz ◽  
R. Schmitt ◽  
H. Maier ◽  
M.-O. Möller

2009 ◽  
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Kelvin G. Lynn ◽  
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Shaoning Yuan ◽  
Sanjeev Solanki ◽  
...  

2013 ◽  
Vol 295-298 ◽  
pp. 322-325
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Lin Jun Wang ◽  
Ji Jun Zhang ◽  
Gao Li Wei ◽  
Kai Feng Qin ◽  
...  

CdMnTe is one of the key materials for room temperature X-ray and gamma-ray detectors on Environmental Analysis and Monitoring. In this paper, the homogeneous Cd1-xMnxTe (x = 0.1) single crystal ingot was grown by the vertical Bridgman method. The compositional analysis was carried out by SEM/EDS. The Te inclusions were revealed by the IR transmission spectra. In dopant distribution was determined by ICP-AES measurement. The resistivity of CdMnTe was cha-racterized by I-V method. It was found that the segregation coefficient of Mn was 0.97. In dopant contents within 3 to 21 ppm of the ingot were found. The Te inclusions were mainly 8.2-28.3m in size and 1×105-1.5×107cm-3in concentration. I–V measurement reveals that sputtered Au film can form good ohmic contact and all the slices have the resistivity within 107 to 109Ωcm.


2017 ◽  
Author(s):  
A. Bolotnikov ◽  
V. Kopach ◽  
O. Kopach ◽  
L. Shcherbak ◽  
P. Fochuk ◽  
...  

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