Study of magnetism in Ni–Cr hardface alloy deposit on 316LN stainless steel using magnetic force microscopy

2015 ◽  
Vol 385 ◽  
pp. 112-118 ◽  
Author(s):  
G.V.K. Kishore ◽  
Anish Kumar ◽  
Gopa Chakraborty ◽  
S.K Albert ◽  
B. Purna Chandra Rao ◽  
...  
Keyword(s):  
Stainless Steel ◽  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Force Microscopy ◽  
316Ln Stainless Steel ◽  
Alloy Deposit

Nanoscale Material Characterization under the Influence of Aggressive Agents by Magnetic Force Microscopy and Opto-Magnetic Spectroscopy

2013 ◽  
Vol 633 ◽  
pp. 209-223
Author(s):  
Aleksandra Debeljkovic ◽  
Ivana Mileusnic ◽  
Ivan Djuricic ◽  
Aleksandra Dragicevic ◽  
Igor Hut ◽  
...  
Keyword(s):  
Stainless Steel ◽  
Material Characterization ◽  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Steel Plate ◽  
Aggressive Medium ◽  
Nanoscale Material ◽  
Force Microscopy ◽  
Magnetic Features

Magnetic Force Microscopy (MFM) and Opto-Magnetic Spectroscopy (OMS) were used to characterize HTCV stainless steel and aluminum. Both materials were immersed in 1.0M HCl and 1.0M CH3COOH solutions for two hours. From the OMS method it was discovered that treated materials showed differences in peak wavelengths. Topographical and magnetic features for steel plate samples showed better resistance to an aggressive medium compared to aluminum. The results and analysis of these investigations are compared and presented in this paper.

Study of MFM Application in Semiconductor Failure Analysis

2004 ◽  
Author(s):  
Way-Jam Chen ◽  
Lily Shiau ◽  
Ming-Ching Huang ◽  
Chia-Hsing Chao
Keyword(s):  
Magnetic Field ◽  
Failure Analysis ◽  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Current Flow ◽  
Force Microscopy ◽  
The Magnetic Field ◽  
A Current

Abstract In this study we have investigated the magnetic field associated with a current flowing in a circuit using Magnetic Force Microscopy (MFM). The technique is able to identify the magnetic field associated with a current flow and has potential for failure analysis.

scholarly journals Magnetic Force Microscopy: Comparison and Validation of Different Magnetic Force Microscopy Calibration Schemes (Small 11/2020)

Small ◽  
2020 ◽  
Vol 16 (11) ◽  
pp. 2070058
Author(s):  
Héctor Corte‐León ◽  
Volker Neu ◽  
Alessandra Manzin ◽  
Craig Barton ◽  
Yuanjun Tang ◽  
...  
Keyword(s):  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Force Microscopy
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