Nanoscale Material Characterization under the Influence of Aggressive Agents by Magnetic Force Microscopy and Opto-Magnetic Spectroscopy

2013 ◽  
Vol 633 ◽  
pp. 209-223
Author(s):  
Aleksandra Debeljkovic ◽  
Ivana Mileusnic ◽  
Ivan Djuricic ◽  
Aleksandra Dragicevic ◽  
Igor Hut ◽  
...  

Magnetic Force Microscopy (MFM) and Opto-Magnetic Spectroscopy (OMS) were used to characterize HTCV stainless steel and aluminum. Both materials were immersed in 1.0M HCl and 1.0M CH3COOH solutions for two hours. From the OMS method it was discovered that treated materials showed differences in peak wavelengths. Topographical and magnetic features for steel plate samples showed better resistance to an aggressive medium compared to aluminum. The results and analysis of these investigations are compared and presented in this paper.

2015 ◽  
Vol 385 ◽  
pp. 112-118 ◽  
Author(s):  
G.V.K. Kishore ◽  
Anish Kumar ◽  
Gopa Chakraborty ◽  
S.K Albert ◽  
B. Purna Chandra Rao ◽  
...  

Author(s):  
Way-Jam Chen ◽  
Lily Shiau ◽  
Ming-Ching Huang ◽  
Chia-Hsing Chao

Abstract In this study we have investigated the magnetic field associated with a current flowing in a circuit using Magnetic Force Microscopy (MFM). The technique is able to identify the magnetic field associated with a current flow and has potential for failure analysis.


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