Tensegrital wheel for enhanced planetary surface mobility: Part 1 – Design and evolution

2022 ◽  
Vol 100 ◽  
pp. 11-24
Author(s):  
Georgia Crowther ◽  
Dimitrios (Dimi) Apostolopoulos ◽  
Stuart Heys
2014 ◽  
Vol 95 ◽  
pp. 15-29 ◽  
Author(s):  
Farah Alibay ◽  
Vishnu R. Desaraju ◽  
Jessica E. Duda ◽  
Jeffrey A. Hoffman

Author(s):  
T. S. Kuan

Recent electron diffraction studies have found ordered phases in AlxGa1-xAs, GaAsxSb1-x, and InxGa1-xAs alloy systems, and these ordered phases are likely to be found in many other III-V ternary alloys as well. The presence of ordered phases in these alloys was detected in the diffraction patterns through the appearance of superstructure reflections between the Bragg peaks (Fig. 1). The ordered phase observed in the AlxGa1-xAs and InxGa1-xAs systems is of the CuAu-I type, whereas in GaAsxSb1-x this phase and a chalcopyrite type ordered phase can be present simultaneously. The degree of order in these alloys is strongly dependent on the growth conditions, and during the growth of these alloys, high surface mobility of the depositing species is essential for the onset of ordering. Thus, the growth on atomically flat (110) surfaces usually produces much stronger ordering than the growth on (100) surfaces. The degree of order is also affected by the presence of antiphase boundaries (APBs) in the ordered phase. As shown in Fig. 2(a), a perfectly ordered In0.5Ga0.5As structure grown along the <110> direction consists of alternating InAs and GaAs monolayers, but due to local growth fluctuations, two types of APBs can occur: one involves two consecutive InAs monolayers and the other involves two consecutive GaAs monolayers.


Author(s):  
Klaus-Ruediger Peters

Topographic ultra high resolution can now routinely be established on bulk samples in cold field emission scanning electron microscopy with a second generation of microscopes (FSEM) designed to provide 0.5 nm probe diameters. If such small probes are used for high magnification imaging, topographic contrast is so high that remarkably fine details can be imaged on 2DMSO/osmium-impregnated specimens at ribosome surfaces even without a metal coating. On TCH/osmium-impregnated specimens topographic resolution can be increased further if the SE-I imaging mode is applied. This requires that beam diameter and metal coating thickness be made smaller than the SE range of ~1 nm and background signal contributions be reduced. Subnanometer small probes can be obtained (only) at high accelerating voltages. Subnanometer thin continuous metal films can be produced under the following conditions: self-shadowing effect between metal atoms must be reduced through appropriate deposition techniques and surface mobility of metal atoms must be diminished through high energy sputtering and/or specimen cooling.


Author(s):  
Ernesto Vallerani ◽  
Alberto Della Torre ◽  
Gian Paolo Guizzo ◽  
Igor Vukman

2021 ◽  
Vol 154 (7) ◽  
pp. 074703
Author(s):  
Jaroslav Barták ◽  
Jirí Málek ◽  
Kushal Bagchi ◽  
M. D. Ediger ◽  
Yuhui Li ◽  
...  

Author(s):  
Conrad Zeidler ◽  
Gerrit Woeckner ◽  
Johannes Schöning ◽  
Vincent Vrakking ◽  
Paul Zabel ◽  
...  

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