Interferometric profile scanning system for measuring large planar mirror surface based on single-interferogram analysis using Fourier transform method
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2010 ◽
Vol 17
(1)
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pp. 106-110
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1971 ◽
Vol 15
(4)
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pp. 603-626
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2015 ◽
Vol 75
(6)
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pp. 2473-2480
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