Interferometric profile scanning system for measuring large planar mirror surface based on single-interferogram analysis using Fourier transform method

Measurement ◽  
2018 ◽  
Vol 118 ◽  
pp. 113-119 ◽  
Author(s):  
Jong-Ahn Kim ◽  
Jae Wan Kim ◽  
Chu-Shik Kang ◽  
Jonghan Jin ◽  
Tae Bong Eom
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