A method for multiple soft fault diagnosis of linear analog circuits

Measurement ◽  
2019 ◽  
Vol 131 ◽  
pp. 714-722 ◽  
Author(s):  
Michał Tadeusiewicz ◽  
Stanisław Hałgas
2014 ◽  
Vol 30 (2) ◽  
pp. 243-249 ◽  
Author(s):  
Yongle Xie ◽  
Xifeng Li ◽  
Sanshan Xie ◽  
Xuan Xie ◽  
Qizhong Zhou

2014 ◽  
Vol 21 (4) ◽  
pp. 663-674 ◽  
Author(s):  
Michał Tadeusiewicz ◽  
Stanisław Hałgas

Abstract This paper deals with multiple soft fault diagnosis of nonlinear analog circuits comprising bipolar transistors characterized by the Ebers-Moll model. Resistances of the circuit and beta forward factor of a transistor are considered as potentially faulty parameters. The proposed diagnostic method exploits a strongly nonlinear set of algebraic type equations, which may possess multiple solutions, and is capable of finding different sets of the parameters values which meet the diagnostic test. The equations are written on the basis of node analysis and include DC voltages measured at accessible nodes, as well as some measured currents. The unknown variables are node voltages and the parameters which are considered as potentially faulty. The number of these parameters is larger than the number of the accessible nodes. To solve the set of equations the block relaxation method is used with different assignments of the variables to the blocks. Next, the solutions are corrected using the Newton-Raphson algorithm. As a result, one or more sets of the parameters values which satisfy the diagnostic test are obtained. The proposed approach is illustrated with a numerical example.


2015 ◽  
Vol 31 (2) ◽  
pp. 217-224 ◽  
Author(s):  
Xuan Xie ◽  
Xifeng Li ◽  
Dongjie Bi ◽  
Qizhong Zhou ◽  
Sanshan Xie ◽  
...  

IEEE Access ◽  
2020 ◽  
Vol 8 ◽  
pp. 60951-60963 ◽  
Author(s):  
Yang Li ◽  
Rui Zhang ◽  
Yinjing Guo ◽  
Pengfei Huan ◽  
Manlin Zhang

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