Analog Circuit Soft Fault Diagnosis Based on Sparse Random Projections and K-Nearest Neighbor

Analog circuit fault diagnosis is a key problem in theory of circuit networks and has been investigated by many researchers in recent years. An approach based on sparse random projections (SRPs) and K-nearest neighbor (KNN) to the realization of analog circuit soft fault diagnosis has been presented in this paper. The proposed method uses the wavelet packet energy spectrum and sparse random projections to preprocess the time response for feature extraction. Then, the variables of the fault features are constructed, which are used to form the observation sequences of K-nearest neighbor classifier. K-nearest neighbor classifier is used to accomplish the fault diagnosis of analog circuit. In this paper, four-opamp biquad high-pass filter has been used as simulation example to verify the effectiveness of the proposed method. The simulations show that the proposed method offers higher correct fault location rate in analog circuit soft fault diagnosis application as compared with the other methods.

A Novel Analog Circuit Soft Fault Diagnosis Method Based on Convolutional Neural Network and Backward Difference

This paper develops a novel soft fault diagnosis approach for analog circuits. The proposed method employs the backward difference strategy to process the data, and a novel variant of convolutional neural network, i.e., convolutional neural network with global average pooling (CNN-GAP) is taken for feature extraction and fault classification. Specifically, the measured raw domain response signals are firstly processed by the backward difference strategy and the first-order and the second-order backward difference sequences are generated, which contain the signal variation and the rate of variation characteristics. Then, based on the one-dimensional convolutional neural network, the CNN-GAP is developed by introducing the global average pooling technical. Since global average pooling calculates each input vector’s mean value, the designed CNN-GAP could deal with different lengths of input signals and be applied to diagnose different circuits. Additionally, the first-order and the second-order backward difference sequences along with the raw domain response signals are directly fed into the CNN-GAP, in which the convolutional layers automatically extract and fuse multi-scale features. Finally, fault classification is performed by the fully connected layer of the CNN-GAP. The effectiveness of our proposal is verified by two benchmark circuits under symmetric and asymmetric fault conditions. Experimental results prove that the proposed method outperforms the existing methods in terms of diagnosis accuracy and reliability.