Thickness profiling of transparent plate using wavelength-tuned phase-shifting analysis

Measurement ◽  
2020 ◽  
Vol 161 ◽  
pp. 107870
Author(s):  
Yangjin Kim ◽  
Younghoon Moon ◽  
Kenichi Hibino ◽  
Mamoru Mitsuishi
2014 ◽  
Vol 134 (2) ◽  
pp. 145-152
Author(s):  
Ryuichi Ogahara ◽  
Yuki Kawaura ◽  
Shinichi Iwamoto ◽  
Naohiro Kamikawa ◽  
Masayuki Namba

1993 ◽  
Author(s):  
Eve Van Cauter ◽  
Jeppe Sturis ◽  
Maria M. Byrne ◽  
John D. Blackman ◽  
Neal H. Scherberg ◽  
...  

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