Analysis of the substrate bias effect on the interface trapped charges in junctionless nanowire transistors through low-frequency noise characterization

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Renan Trevisoli ◽  
Michelly de Souza ◽  
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Geoffroy Soubercaze-Pun ◽  
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pp. 064501 ◽  
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M. S. Shur ◽  
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Nanoscale ◽  
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Lorenzo Pimpolari ◽  
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Inkjet printed graphene is in-depth investigated by means of Hall mobility measurements, low-temperature magnetoresistance analysis, and low frequency noise characterization.


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