Image quality of microns-thick specimens in the ultra-high voltage electron microscope

Micron ◽  
2010 ◽  
Vol 41 (5) ◽  
pp. 490-497 ◽  
Author(s):  
Fang Wang ◽  
Hai-Bo Zhang ◽  
Meng Cao ◽  
Ryuji Nishi ◽  
Akio Takaoka
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