Three-dimensional fine structure of the organization of microtubules in neurite varicosities by ultra-high voltage electron microscope tomography

2017 ◽  
Vol 369 (3) ◽  
pp. 467-476 ◽  
Author(s):  
Tomoki Nishida ◽  
Ryoichi Yoshimura ◽  
Yasuhisa Endo
Author(s):  
Kiyoshi Hama ◽  
Toshio Kosaka

The stereo-observation of biological materials can effectively achieved by the high voltage electron microscope utilizing the high penetration power of electrons at high accelerating voltage which enables the observation of thick specimens, and the large depth of forcus resulted by the small angular aperture used in the electron microscope (Hama, 1972). The high voltage electron microscope was applied to the study of the neuroglial cell processes in the cerebellar cortex of monkey and rat by Chang-Palayand Palay (1972). We investigated further the three dimensional organization of the neuroglial cell processes in the cerebellum and retina of rat by means of high voltage electron microscope stereoscopy.The Golgi preparations of cerebellar cortex and retina of rat were prepared by the methods described previously (Stell and Lightfoot, 1975; Colonnier, 1964). Plastic sections 100 μm thick were used for the light microscope observation.


Author(s):  
J.N. Turner ◽  
D.P. Barnard ◽  
G. Matuszek ◽  
C.W. See

A high precision specimen stage is essential for the accurate recording of images for three-dimensional reconstruction. The efficient calculation and resolution of a “tomographic type” three-dimensional reconstruction is influenced by the precision of the angular tilt settings. The ability to identify structures at low magnification and later return to them for detailed study at high magnification is crucial to the efficient study of structures by serial section reconstruction, and is greatly aided by a precise, repeatable translation stage. To study such problems, we have designed and fabricated a single-tilt specimen stage for our high-voltage electron microscope (HVEM), which represents a different design philosophy to that usually employed in side entry stages for transmission electron microscopes.


Micron ◽  
2010 ◽  
Vol 41 (5) ◽  
pp. 490-497 ◽  
Author(s):  
Fang Wang ◽  
Hai-Bo Zhang ◽  
Meng Cao ◽  
Ryuji Nishi ◽  
Akio Takaoka

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