scholarly journals Large-scale electronic-structure theory and nanoscale defects formed in cleavage process of silicon

2006 ◽  
Vol 376-377 ◽  
pp. 975-978 ◽  
Author(s):  
T. Hoshi ◽  
R. Takayama ◽  
Y. Iguchi ◽  
T. Fujiwara
Author(s):  
Uğur Bozkaya ◽  
Betül Ermiş ◽  
Yavuz Alagöz ◽  
Asli Unal ◽  
Ali Kaan Uyar

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