Bursting phenomena as well as the bifurcation mechanism in controlled Lorenz oscillator with two time scales

2011 ◽  
Vol 375 (8) ◽  
pp. 1183-1190 ◽  
Author(s):  
Qinsheng Bi ◽  
Zhengdi Zhang
Keyword(s):  
Time Scales ◽  
Bifurcation Mechanism ◽  
Bursting Phenomena

Bursting oscillations and bifurcation mechanism in memristor-based Shimizu–Morioka system with two time scales

2019 ◽  
Vol 128 ◽  
pp. 58-70 ◽  
Author(s):  
Zihao Wen ◽  
Zhijun Li ◽  
Xiang Li
Keyword(s):  
Time Scales ◽  
Bifurcation Mechanism ◽  
Bursting Oscillations

Bursting phenomena as well as the bifurcation mechanism in a coupled BVP oscillator with periodic excitation

2016 ◽  
Vol 25 (7) ◽  
pp. 070501 ◽  
Author(s):  
Xiaofang Zhang ◽  
Lei Wu ◽  
Qinsheng Bi
Keyword(s):  
Periodic Excitation ◽  
Bifurcation Mechanism ◽  
Bursting Phenomena

scholarly journals Bursting oscillation and bifurcation mechanism in fractional-order Brusselator with two different time scales

2017 ◽  
Vol 19 (2) ◽  
pp. 1453-1464 ◽  
Author(s):  
Xianghong Li ◽  
Jufeng Chen ◽  
Jingyu Hou ◽  
Dawei Zuo
Keyword(s):  
Time Scales ◽  
Fractional Order ◽  
Bifurcation Mechanism ◽  
Bursting Oscillation ◽  
Different Time Scales

Bifurcation mechanism of the bursting oscillations in periodically excited dynamical system with two time scales

2014 ◽  
Vol 79 (1) ◽  
pp. 101-110 ◽  
Author(s):  
Qinsheng Bi ◽  
Rui Ma ◽  
Zhengdi Zhang
Keyword(s):  
Dynamical System ◽  
Time Scales ◽  
Bifurcation Mechanism ◽  
Bursting Oscillations

LVSEM: Past Present and Future

1990 ◽  
Vol 48 (1) ◽  
pp. 364-365
Author(s):  
James B. Pawley
Keyword(s):  
Field Emission ◽  
Line Width ◽  
Time Scales ◽  
Silicon Oxide ◽  
Beam Current ◽  
High Brightness ◽  
High Beam ◽  
Fixed Charges ◽  
Beam Voltage ◽  
Deposited Metal

Past: In 1960 Thornley published the first description of SEM studies carried out at low beam voltage (LVSEM, 1-5 kV). The aim was to reduce charging on insulators but increased contrast and difficulties with low beam current and frozen biological specimens were also noted. These disadvantages prevented widespread use of LVSEM except by a few enthusiasts such as Boyde. An exception was its use in connection with studies in which biological specimens were dissected in the SEM as this process destroyed the conducting films and produced charging unless LVSEM was used.In the 1980’s field emission (FE) SEM’s came into more common use. The high brightness and smaller energy spread characteristic of the FE-SEM’s greatly reduced the practical resolution penalty associated with LVSEM and the number of investigators taking advantage of the technique rapidly expanded; led by those studying semiconductors. In semiconductor research, the SEM is used to measure the line-width of the deposited metal conductors and of the features of the photo-resist used to form them. In addition, the SEM is used to measure the surface potentials of operating circuits with sub-micrometer resolution and on pico-second time scales. Because high beam voltages destroy semiconductors by injecting fixed charges into silicon oxide insulators, these studies must be performed using LVSEM where the beam does not penetrate so far.

SPECTRAL DIFFUSION AND RELAXATION OF PHOTOCHEMICAL HOLES ON LOGARITHMIC TIME SCALES

1985 ◽  
Vol 46 (C7) ◽  
pp. C7-357-C7-361 ◽  
Author(s):  
J. Friedrich ◽  
D. Haarer
Keyword(s):  
Time Scales ◽  
Spectral Diffusion

Controllability And Observability Of Kronecker Product Sylvester System On Time Scales

2012 ◽  
Vol 1 (1) ◽  
pp. 47-56
Author(s):  
B V Appa Rao ◽  
Rachel Kezia ◽  
K A S N V Prasad
Keyword(s):  
Time Scales ◽  
Kronecker Product ◽  
Controllability And Observability

A Two Time Scales Turbulence Model of Turbulent Bubbly Flows

2013 ◽  
Vol 40 (3) ◽  
pp. 185-203
Author(s):  
Dhahri Maher ◽  
Bellakhel Ghazi ◽  
Chahed Jamel
Keyword(s):  
Time Scales ◽  
Turbulence Model ◽  
Bubbly Flows

Sparsity and Time Scales

1983 ◽  
Author(s):  
Joe H. Chow ◽  
Petar V. Kokotovic
Keyword(s):  
Time Scales
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