Characterization of Dy2S3 thin films deposited by successive ionic layer adsorption and reaction (SILAR) method
2006 ◽
Vol 29
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pp. 165-168
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2001 ◽
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pp. 101-104
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2000 ◽
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pp. 230-234
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2000 ◽
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pp. 1345-1353
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1998 ◽
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pp. 453-459
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2020 ◽
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pp. 6235-6244
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pp. 1095-1100
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pp. 9466-9473
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2016 ◽
Vol 686
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