Electronic and mechanical properties of monocrystalline silicon doped with trace content of N or P: A first-principles study
Keyword(s):
Keyword(s):
2019 ◽
Vol 111
◽
pp. 158-166
◽
2018 ◽
Vol 6
(2)
◽
pp. 026522
◽
2018 ◽
Vol 137
◽
pp. 295-302
◽