Experimental and analytical study of saturation current density of laser-doped phosphorus emitters for silicon solar cells

2011 ◽  
Vol 95 (8) ◽  
pp. 2536-2539 ◽  
Author(s):  
B. Paviet-Salomon ◽  
S. Gall ◽  
R. Monna ◽  
S. Manuel ◽  
A. Slaoui
Keyword(s):  
Solar Cells ◽  
Current Density ◽  
Analytical Study ◽  
Silicon Solar Cells ◽  
Saturation Current ◽  
Saturation Current Density

scholarly journals Reducing Saturation-Current Density to Realize High-Efficiency Low-Bandgap Mixed Tin-Lead Halide Perovskite Solar Cells

2018 ◽  
Vol 9 (3) ◽  
pp. 1803135 ◽  
Author(s):  
Chongwen Li ◽  
Zhaoning Song ◽  
Dewei Zhao ◽  
Chuanxiao Xiao ◽  
Biwas Subedi ◽  
...  
Keyword(s):  
Solar Cells ◽  
Current Density ◽  
High Efficiency ◽  
Perovskite Solar Cells ◽  
Saturation Current ◽  
Low Bandgap ◽  
Saturation Current Density ◽  
Halide Perovskite ◽  
Lead Halide

Effects of diffusion process on potential induced degradation of silicon solar cells

2018 ◽  
Vol 16 (1_suppl) ◽  
pp. 64-69
Author(s):  
Xianfang Gou ◽  
Xiaoyan Li ◽  
Shaoliang Wang ◽  
Xixi Huang ◽  
Su Zhou ◽  
...  
Keyword(s):  
Solar Cells ◽  
Sheet Resistance ◽  
Minority Carrier ◽  
Minority Carrier Lifetime ◽  
Doping Profile ◽  
Electrical Performance ◽  
Silicon Solar Cells ◽  
Saturation Current ◽  
Cell Efficiency ◽  
Saturation Current Density

Background: Potential induced degradation (PID) has recently been identified as one of the most important degradation mechanisms for silicon solar cells. It is widely considered that PID is closely related with the manufacture and application period of solar modules. Methods: In this study, the effects of diffusion sheet resistance on PID were verified and explained by testing the emitter doping profile, the minority carrier lifetime, the emitter saturation current, the electrical performance of different cells, and the PID process. Results: With increasing sheet resistance of cells, the depth and saturation current density of the emitter both decreased, and the cell efficiency increased, whereas the PID phenomenon became serious. Conclusions: It was found that higher sheet resistance or thinner P–N junction could lead to higher PID sensitivity. Therefore, more attention should be paid to PID phenomenon as the photovoltaic industry develops in the direction of high sheet resistance.

Atmospheric TIG Arc Diagnostics with a Low Disturbance Electrostatic Probe

2013 ◽  
Vol 652-654 ◽  
pp. 2239-2243
Author(s):  
Yuan Bo Li ◽  
Liang Zhu
Keyword(s):  
Current Density ◽  
Longitudinal Direction ◽  
Axial Direction ◽  
Half Width ◽  
Arc Plasma ◽  
Plasma Diagnostic ◽  
Saturation Current ◽  
Sweeping Motion ◽  
Saturation Current Density ◽  
Electrostatic Probe

The use of electrostatic probe is available and simple in atmospheric TIG arc plasma diagnostic. Usually electrostatic probe takes disturbance in arc plasma due to sweeping motion. A low disturbance electrostatic probe was developed. This probe consisted of aluminum wire and moved through arc plasma along probe’s longitudinal direction to avoid sweeping motion. And the signal collected by this probe required Abel inversion to convert into the value per 1 mm probe length. With the application of the low disturbance probe in biased condition, ion saturation current density in various sections along the axial direction of TIG arc was obtained. The result shows that half width and peak value of ion saturation current density increase with the enhance of arc current; the radius of current-carrying area can be estimated by the half width of ion saturation current density; along the axial direction of TIG arc, the radius of current-carrying area change to the minimum near cathode.

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