Correlation of structural and optoelectronic properties of thin film silicon prepared at the transition from microcrystalline to amorphous growth

2009 ◽  
Vol 517 (23) ◽  
pp. 6392-6395 ◽  
Author(s):  
Steve Reynolds ◽  
Reinhard Carius ◽  
Friedhelm Finger ◽  
Vladimir Smirnov
2018 ◽  
Vol 221 ◽  
pp. 22-25 ◽  
Author(s):  
M.M.I. Sapeli ◽  
M.T. Ferdaous ◽  
S.A. Shahahmadi ◽  
K. Sopian ◽  
P. Chelvanathan ◽  
...  

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