Complex refractive index of InXGa1-XN thin films grown on cubic (100) GaN/MgO

2017 ◽  
Vol 626 ◽  
pp. 55-59 ◽  
Author(s):  
H. Vilchis ◽  
V.D. Compeán-García ◽  
I.E. Orozco-Hinostroza ◽  
E. López-Luna ◽  
M.A. Vidal ◽  
...  
Keyword(s):  
Thin Films ◽  
Refractive Index ◽  
Complex Refractive Index

Complex Refractive Index of a-Si:F Thin Films

1992 ◽  
pp. 381-383
Author(s):  
M. García-Castañeda ◽  
A. Mariño-Camargo
Keyword(s):  
Thin Films ◽  
Refractive Index ◽  
Complex Refractive Index

Determination of thin film refractive index and thickness by means of film phase thickness

Open Physics ◽  
2008 ◽  
Vol 6 (2) ◽  
Author(s):  
Milen Nenkov ◽  
Tamara Pencheva
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Refractive Index ◽  
Barium Titanate ◽  
Spectral Region ◽  
Complex Refractive Index ◽  
Refractive Index Dispersion ◽  
New Approach ◽  
Phase Thickness

AbstractA new approach for determination of refractive index dispersion n(λ) (the real part of the complex refractive index) and thickness d of thin films of negligible absorption and weak dispersion is proposed. The calculation procedure is based on determination of the phase thickness of the film in the spectral region of measured transmittance data. All points of measured spectra are included in the calculations. Barium titanate thin films are investigated in the spectral region 0.38–0.78 μm and their n(λ) and d are calculated. The approach is validated using Swanepoel’s method and it is found to be applicable for relatively thin films when measured transmittance spectra have one minimum and one maximum only.

A method for the determination of the complex refractive index of non-metallic thin films using photometric measurements at normal incidence

1983 ◽  
Vol 100 (2) ◽  
pp. 155-168 ◽  
Author(s):  
J.I. Cisneros ◽  
G.B. Rego ◽  
M. Tomyiama ◽  
S. Bilac ◽  
J.M. Gonçalves ◽  
...  
Keyword(s):  
Thin Films ◽  
Refractive Index ◽  
Complex Refractive Index ◽  
Normal Incidence ◽  
Metallic Thin Films ◽  
Photometric Measurements

Alterations in the complex refractive index of copper oxide thin films as sensing effect for hydrogen sulfide monitoring

2013 ◽  
Vol 20 (4-5) ◽  
pp. 607-613 ◽  
Author(s):  
Janosch Kneer ◽  
Manuel Boxberg ◽  
Sebastian Busch ◽  
André Eberhardt ◽  
Stefan Palzer ◽  
...  
Keyword(s):  
Thin Films ◽  
Refractive Index ◽  
Hydrogen Sulfide ◽  
Copper Oxide ◽  
Complex Refractive Index ◽  
Oxide Thin Films

Absolute Absorption Intensity and Dispersion Measurements on Some Organic Liquids in the Infrared

1980 ◽  
Vol 34 (6) ◽  
pp. 657-691 ◽  
Author(s):  
T. G. Goplen ◽  
D. G. Cameron ◽  
R. N. Jones
Keyword(s):  
Thin Films ◽  
Refractive Index ◽  
Complex Refractive Index ◽  
Total Reflection ◽  
Attenuated Total Reflection ◽  
Organic Liquids ◽  
Absorption Coefficients ◽  
Absorption Intensity ◽  
Transmission Measurements ◽  
Infrared Absorption Spectra

The infrared absorption spectra and corresponding dispersion spectra of the following liquids have been measured over the range 4200 to 250 cm−1: cyclo-C5H10, CH3·NO2, CH3·CN, CH2Br2, CH2Cl2, CBrCl3, CCl4, C6H6, C6H5·CH3, C6H5Cl, C6H5Br, C6H5I, and C6F6. The spectra were measured in the absence of solvent and the results are reported as the real and imaginary components of the complex refractive index ( n, k). The experimental technique combines transmission measurements through thin films and attenuated total reflection measurements by a method which has been described previously. The complete spectral and dispersion curves are displayed graphically; the absorption maxima are tabulated as absorption indices ( kmax) and as molar absorption coefficients (εmax). The dispersion extrema ( nmin, nmax) are also listed and the experimental uncertainties in these quantities are evaluated. Provision is made to supply the complete optical constant data on magnetic tape at encoded intervals of 0.5 cm−1.

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