scholarly journals Efficient phase contrast imaging in STEM using a pixelated detector. Part 1: Experimental demonstration at atomic resolution

2015 ◽  
Vol 151 ◽  
pp. 160-167 ◽  
Author(s):  
Timothy J. Pennycook ◽  
Andrew R. Lupini ◽  
Hao Yang ◽  
Matthew F. Murfitt ◽  
Lewys Jones ◽  
...  
Keyword(s):  
Phase Contrast ◽  
Atomic Resolution ◽  
Phase Contrast Imaging ◽  
Experimental Demonstration ◽  
Contrast Imaging ◽  
Detector Part

scholarly journals Atomic resolution ptychographic phase contrast imaging of polar-ordered structures in functional oxides

2015 ◽  
Vol 21 (S3) ◽  
pp. 1221-1222 ◽  
Author(s):  
Ian MacLaren ◽  
Hao Yang ◽  
Lewys Jones ◽  
Peter D. Nellist ◽  
Henning Ryll ◽  
...  
Keyword(s):  
Phase Contrast ◽  
Atomic Resolution ◽  
Phase Contrast Imaging ◽  
Functional Oxides ◽  
Contrast Imaging ◽  
Ordered Structures

Atomic Resolution Phase Contrast Imaging and In-Line Holography Using Variable Voltage and Dose Rate

2012 ◽  
Vol 18 (5) ◽  
pp. 982-994 ◽  
Author(s):  
Bastian Barton ◽  
Bin Jiang ◽  
ChengYu Song ◽  
Petra Specht ◽  
Hector Calderon ◽  
...  
Keyword(s):  
Dose Rate ◽  
Phase Contrast ◽  
High Dose Rate ◽  
Wave Functions ◽  
Atomic Resolution ◽  
Phase Contrast Imaging ◽  
High Dose ◽  
Contrast Imaging ◽  
Variable Voltage ◽  
Wide Range

AbstractThe TEAM 0.5 electron microscope is employed to demonstrate atomic resolution phase contrast imaging and focal series reconstruction with acceleration voltages between 20 and 300 kV and a variable dose rate. A monochromator with an energy spread of ≤0.1 eV is used for dose variation by a factor of 1,000 and to provide a beam-limiting aperture. The sub-Ångstrøm performance of the instrument remains uncompromised. Using samples obtained from silicon wafers by chemical etching, the [200] atom dumbbell distance of 1.36 Å can be resolved in single images and reconstructed exit wave functions at 300, 80, and 50 kV. At 20 kV, atomic resolution <2 Å is readily available but limited by residual lens aberrations at large scattering angles. Exit wave functions reconstructed from images recorded under low dose rate conditions show sharper atom peaks as compared to high dose rate. The observed dose rate dependence of the signal is explained by a reduction of beam-induced atom displacements. If a combined sample and instrument instability is considered, the experimental image contrast can be matched quantitatively to simulations. The described development allows for atomic resolution transmission electron microscopy of interfaces between soft and hard materials over a wide range of voltages and electron doses.

scholarly journals Quantitative Atomic Resolution Differential Phase Contrast Imaging Using a Segmented Area All Field Detector

2016 ◽  
Vol 22 (S3) ◽  
pp. 504-505
Author(s):  
Gabriel Sanchez-Santolino ◽  
Takehito Seki ◽  
Nathan Lugg ◽  
Ryo Ishikawa ◽  
Daniel J. Taplin ◽  
...  
Keyword(s):  
Phase Contrast ◽  
Atomic Resolution ◽  
Phase Contrast Imaging ◽  
Contrast Imaging ◽  
Differential Phase ◽  
Differential Phase Contrast

scholarly journals Atomic-Resolution Differential Phase Contrast Imaging by STEM

2011 ◽  
Vol 17 (S2) ◽  
pp. 1256-1257 ◽  
Author(s):  
N Shibata ◽  
S Findlay ◽  
Y Ikuhara
Keyword(s):  
Phase Contrast ◽  
Atomic Resolution ◽  
Phase Contrast Imaging ◽  
Contrast Imaging ◽  
Differential Phase ◽  
Differential Phase Contrast

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

scholarly journals Phase-contrast imaging of multiply-scattering extended objects at atomic resolution by reconstruction of the scattering matrix

2021 ◽  
Vol 3 (2) ◽  
Author(s):  
Philipp M. Pelz ◽  
Hamish G. Brown ◽  
Scott Stonemeyer ◽  
Scott D. Findlay ◽  
Alex Zettl ◽  
...  
Keyword(s):  
Phase Contrast ◽  
Scattering Matrix ◽  
Atomic Resolution ◽  
Phase Contrast Imaging ◽  
Contrast Imaging

Image Quality Analysis of X-ray Grating Interferometer Using Integrating-bucket Method

2020 ◽  
Vol 64 (2) ◽  
pp. 20503-1-20503-5
Author(s):  
Faiz Wali ◽  
Shenghao Wang ◽  
Ji Li ◽  
Jianheng Huang ◽  
Yaohu Lei ◽  
...  
Keyword(s):  
Image Quality ◽  
Phase Contrast ◽  
Quality Analysis ◽  
Phase Contrast Imaging ◽  
Phase Image ◽  
Contrast Imaging ◽  
High Quality ◽  
Image Quality Analysis ◽  
X Ray ◽  
Grating Interferometer

Abstract Grating-based x-ray phase-contrast imaging has the potential to enhance image quality and provide inner structure details non-destructively. In this work, using grating-based x-ray phase-contrast imaging system and employing integrating-bucket method, the quantitative expressions of signal-to-noise ratios due to photon statistics and mechanical error are analyzed in detail. Photon statistical noise and mechanical error are the main sources affecting the image noise in x-ray grating interferometry. Integrating-bucket method is a new phase extraction method translated to x-ray grating interferometry; hence, its image quality analysis would be of great importance to get high-quality phase image. The authors’ conclusions provide an alternate method to get high-quality refraction signal using grating interferometer, and hence increases applicability of grating interferometry in preclinical and clinical usage.

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