Subsurface imaging of rigid particles buried in a polymer matrix based on atomic force microscopy mechanical sensing

2019 ◽  
Vol 207 ◽  
pp. 112832 ◽  
Author(s):  
Weijie Zhang ◽  
Yuhang Chen ◽  
Yaoping Hou ◽  
Wenting Wang ◽  
Huarong Liu ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Polymer Matrix ◽  
Subsurface Imaging ◽  
Force Microscopy ◽  
Rigid Particles ◽  
Atomic Force ◽  
Mechanical Sensing

scholarly journals Subsurface imaging of flexible circuits via contact resonance atomic force microscopy

2019 ◽  
Vol 10 ◽  
pp. 1636-1647 ◽  
Author(s):  
Wenting Wang ◽  
Chengfu Ma ◽  
Yuhang Chen ◽  
Lei Zheng ◽  
Huarong Liu ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Theoretical Calculations ◽  
Contact Stiffness ◽  
Metal Layer ◽  
Experimental Results ◽  
Subsurface Imaging ◽  
Force Microscopy ◽  
Atomic Force ◽  
Cover Thickness ◽  
Contact Resonance

Subsurface imaging of Au circuit structures embedded in poly(methyl methacrylate) (PMMA) thin films with a cover thickness ranging from 52 to 653 nm was carried out by using contact resonance atomic force microscopy (CR-AFM). The mechanical difference of the embedded metal layer leads to an obvious CR-AFM frequency shift and therefore its unambiguous differentiation from the polymer matrix. The contact stiffness contrast, determined from the tracked frequency images, was employed for quantitative evaluation. The influence of various parameter settings and sample properties was systematically investigated by combining experimental results with theoretical analysis from finite element simulations. The results show that imaging with a softer cantilever and a lower eigenmode will improve the subsurface contrast. The experimental results and theoretical calculations provide a guide to optimizing parameter settings for the nondestructive diagnosis of flexible circuits. Defect detection of the embedded circuit pattern was also carried out, which indicates the capability of imaging tiny subsurface structures smaller than 100 nm by using CR-AFM.

scholarly journals Advances in quantitative nanoscale subsurface imaging by mode-synthesizing atomic force microscopy

2014 ◽  
Vol 105 (5) ◽  
pp. 053110 ◽  
Author(s):  
P. Vitry ◽  
E. Bourillot ◽  
C. Plassard ◽  
Y. Lacroute ◽  
L. Tetard ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Subsurface Imaging ◽  
Force Microscopy ◽  
Atomic Force

Mechanical sensing of the penetration of various nanoneedles into a living cell using atomic force microscopy

2005 ◽  
Vol 20 (8) ◽  
pp. 1652-1655 ◽  
Author(s):  
Ikuo Obataya ◽  
Chikashi Nakamura ◽  
SungWoong Han ◽  
Noriyuki Nakamura ◽  
Jun Miyake
Keyword(s):  
Atomic Force Microscopy ◽  
Living Cell ◽  
Force Microscopy ◽  
Atomic Force ◽  
Mechanical Sensing

Study on the Structures and Surface Forces of Different Carbon Blacks by Atomic Force Microscopy

2014 ◽  
Vol 496-500 ◽  
pp. 106-109 ◽  
Author(s):  
Qing Shan Fu ◽  
Jian Chen ◽  
Zu Xiao Yu ◽  
Rui Song Yang
Keyword(s):  
Atomic Force Microscopy ◽  
Carbon Black ◽  
Polymer Matrix ◽  
Dibutyl Phthalate ◽  
Surface Forces ◽  
Surface Absorption ◽  
Force Microscopy ◽  
Carbon Blacks ◽  
Atomic Force ◽  
High Structure

Carbon blacks are used universally as fillers in polymer matrix for mechanical, electronical and thermal properties improvement. Plenty of studies show that the structure and surface properties affect the function of carbon blacks in polymer matrix intensively. However, the reinforcing mechanism is still controversial. In this study, we studied the structure of three carbon blacks by Dibutyl phthalate (DBP) absorption and atomic force microscopy (AFM) and analyzed the absorption/desorption forces of the three carbon blacks surface by force-distance curves. The results show that the carbon black with relatively high structure possesses more branches and bigger aggregation morphologies and shows the highest surface absorption/desorption forces, which may increase the reaction between carbon black and polymer matrix.

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