Contrast Mechanism of Ultrasonic-based Atomic Force Microscopy for Subsurface Imaging

Author(s):  
Chengfu Ma ◽  
Yuhang Chen ◽  
Walter Arnold
2019 ◽  
Vol 10 ◽  
pp. 1636-1647 ◽  
Author(s):  
Wenting Wang ◽  
Chengfu Ma ◽  
Yuhang Chen ◽  
Lei Zheng ◽  
Huarong Liu ◽  
...  

Subsurface imaging of Au circuit structures embedded in poly(methyl methacrylate) (PMMA) thin films with a cover thickness ranging from 52 to 653 nm was carried out by using contact resonance atomic force microscopy (CR-AFM). The mechanical difference of the embedded metal layer leads to an obvious CR-AFM frequency shift and therefore its unambiguous differentiation from the polymer matrix. The contact stiffness contrast, determined from the tracked frequency images, was employed for quantitative evaluation. The influence of various parameter settings and sample properties was systematically investigated by combining experimental results with theoretical analysis from finite element simulations. The results show that imaging with a softer cantilever and a lower eigenmode will improve the subsurface contrast. The experimental results and theoretical calculations provide a guide to optimizing parameter settings for the nondestructive diagnosis of flexible circuits. Defect detection of the embedded circuit pattern was also carried out, which indicates the capability of imaging tiny subsurface structures smaller than 100 nm by using CR-AFM.


2014 ◽  
Vol 105 (5) ◽  
pp. 053110 ◽  
Author(s):  
P. Vitry ◽  
E. Bourillot ◽  
C. Plassard ◽  
Y. Lacroute ◽  
L. Tetard ◽  
...  

1994 ◽  
Vol 107 (5) ◽  
pp. 1105-1114 ◽  
Author(s):  
J.H. Hoh ◽  
C.A. Schoenenberger

We describe the morphology and mechanical stability of the apical surface of MDCK monolayers by atomic force microscopy (AFM). Living cells could be imaged in physiological solution for several hours without noticeable deterioration. Cell boundaries appear as ridges that clearly demarcate neighboring cells. In some cases the nucleus of individual cells could be seen, though apparently only in very thin areas of the monolayer. Two types of protrusions on the surface could be visualized. Smooth bulges that varied in width from a few hundred nanometers to several micrometers, which appear to represent relatively rigid subapical structures. Another type of protrusion extended well above the membrane and was swept back and forth during the imaging. However, the microvilli that are typically present on the apical surface could not be resolved. For comparison, a transformed MDCK cell line expressing the K-ras oncogene was also examined. When cultured on solid substrata at low density, the R5 cells spread out and are less than 100 nm thick over large areas with both extensive processes and rounded edges. Many intracellular structures such as the nucleus, cytoskeletal elements and vesicles could be visualized. None of the intracellular structures seen in the AFM images could be seen by scanning electron microscopy. Both R5 cells and MDCK monolayers required imaging forces of > 2 nN for good image contrast. Force measurements on the MDCK monolayers show that they are very soft, with an effective spring constant of approximately 0.002 N/m for the apical plasma membrane, over the first micrometer of deformation, resulting in a height deformation of approximately 500 nm per nanoNewton of applied force. The mechanical properties of the cells could be manipulated by addition of glutaraldehyde. These changes were monitored in real time by collecting force curves during the fixation reaction. The curves show a stiffening of the apical plasma membrane that was completed in approximately 1 minute. On the basis of these measurements and the imaging forces required, we conclude that deformation of the plasma membrane is an important component of the contrast mechanism, in effect ‘staining’ structures based on their relative rigidity.


2010 ◽  
Vol 108 (9) ◽  
pp. 094311 ◽  
Author(s):  
Yagun Zhao ◽  
Qian Cheng ◽  
Menglu Qian ◽  
John H. Cantrell

2019 ◽  
Vol 207 ◽  
pp. 112832 ◽  
Author(s):  
Weijie Zhang ◽  
Yuhang Chen ◽  
Yaoping Hou ◽  
Wenting Wang ◽  
Huarong Liu ◽  
...  

2018 ◽  
Vol 113 (19) ◽  
pp. 193105 ◽  
Author(s):  
Weijie Zhang ◽  
Yuhang Chen ◽  
Huarong Liu ◽  
Lei Zheng

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