The scattering mechanism analysis of anisotropic (00l)-orientation bismuth films based on magnetoresistance measurement method

Vacuum ◽  
2021 ◽  
Vol 191 ◽  
pp. 110360
Author(s):  
Nan Wang ◽  
Yang Qi
Author(s):  
Fabio Weishaupt ◽  
Ayesha Uzair ◽  
Roland Moch ◽  
Hans-Ludwig Bloecher ◽  
Julius F. Tilly ◽  
...  

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