Determination of trace impurities in high-purity aluminium oxide by high resolution inductively coupled plasma mass spectrometry

1998 ◽  
Vol 369 (1-2) ◽  
pp. 79-85 ◽  
Author(s):  
Kiyoshi Nakane ◽  
Yoshinori Uwamino ◽  
Hisashi Morikawa ◽  
Akira Tsuge ◽  
Toshio Ishizuka
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