An x-ray diffraction study of grain boundary inclusions in steel
1940 ◽
Vol 229
(2)
◽
pp. 191-199
1944 ◽
Vol 237
(6)
◽
pp. 443-450
An X-ray diffraction study of direct-bonded silicon interfaces: A model semiconductor grain boundary
1998 ◽
Vol 248
(1-4)
◽
pp. 74-78
◽
1986 ◽
Vol 47
(1)
◽
pp. 133-138
◽
1987 ◽
Vol 48
(8)
◽
pp. 1357-1361
◽
1980 ◽
Vol 41
(C1)
◽
pp. C1-145-C1-146
◽
2007 ◽
Vol 2007
(suppl_26)
◽
pp. 477-482