An X-ray diffraction study of direct-bonded silicon interfaces: A model semiconductor grain boundary

1998 ◽  
Vol 248 (1-4) ◽  
pp. 74-78 ◽  
Author(s):  
P.B. Howes ◽  
M. Benamara ◽  
F. Grey ◽  
R. Feidenhansl ◽  
M. Nielsen ◽  
...  
2010 ◽  
Vol 1 (SRMS-7) ◽  
Author(s):  
S. D. Rhead ◽  
P. B. Howes ◽  
M. Roy ◽  
J. L. Rawle ◽  
C. Nicklin ◽  
...  

We present an X-ray diffraction study of a semiconductor symmetric tilt grain boundary. The theory of crystal truncation rod scattering is extended to bicrystal interfaces and compared with experimental data measured at the Diamond Light Source.


1940 ◽  
Vol 229 (2) ◽  
pp. 191-199
Author(s):  
Raymond Morgan ◽  
Sylvia Steckler ◽  
E.B. Schwartz

1986 ◽  
Vol 47 (1) ◽  
pp. 133-138 ◽  
Author(s):  
D. Guillon ◽  
A. Skoulios ◽  
J.J. Benattar

1987 ◽  
Vol 48 (8) ◽  
pp. 1357-1361 ◽  
Author(s):  
F. Dénoyer ◽  
G. Heger ◽  
M. Lambert ◽  
J.M. Lang ◽  
P. Sainfort

1980 ◽  
Vol 41 (C1) ◽  
pp. C1-145-C1-146 ◽  
Author(s):  
B. Greenberg ◽  
G. M. Rothberg

2007 ◽  
Vol 2007 (suppl_26) ◽  
pp. 477-482
Author(s):  
W. Nowicki ◽  
J. Darul ◽  
P. Piszora ◽  
C. Baehtz ◽  
E. Wolska

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