X-ray diffraction study of a Si Σ13 symmetric tilt grain boundary
Keyword(s):
X Ray
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We present an X-ray diffraction study of a semiconductor symmetric tilt grain boundary. The theory of crystal truncation rod scattering is extended to bicrystal interfaces and compared with experimental data measured at the Diamond Light Source.
2011 ◽
Vol 626-627
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pp. 144-146
Keyword(s):
1944 ◽
Vol 237
(6)
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pp. 443-450
An X-ray diffraction study of direct-bonded silicon interfaces: A model semiconductor grain boundary
1998 ◽
Vol 248
(1-4)
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pp. 74-78
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1940 ◽
Vol 229
(2)
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pp. 191-199
1986 ◽
Vol 47
(1)
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pp. 133-138
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1987 ◽
Vol 48
(8)
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pp. 1357-1361
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