A transient model for the sublimation growth of silicon carbide single crystals

1999 ◽  
Vol 205 (3) ◽  
pp. 294-304 ◽  
Author(s):  
Nikolaus Bubner ◽  
Olaf Klein ◽  
Peter Philip ◽  
Jürgen Sprekels ◽  
Krzysztof Wilmański
2018 ◽  
Vol 185 ◽  
pp. 04007 ◽  
Author(s):  
A.N. Taldenkov ◽  
A.V. Inyushkin ◽  
E.A. Chistotina ◽  
V.G. Ralchenko ◽  
A.P. Bolshakov ◽  
...  

The magnetic properties of single crystals of synthetic diamond and crystals of silicon carbide were studied. High-purity samples of diamonds synthesized with HPHT and CVD technologies were used. The crystals of silicon carbide were grown by sublimation and industrial technology. Along with samples with a natural isotopic composition, monoisotopic crystals of diamond (99.96% 12C and 99.96% 13C) and silicon carbide (99.993% of 28Si) were studied. On the basis of the data obtained, the diamagnetic susceptibility was determined and the concentration of paramagnetic centers and the content of the ferromagnetic component were evaluated. The results are discussed.


2007 ◽  
Vol 16 (3) ◽  
pp. 654-657 ◽  
Author(s):  
Xiang-Biao Li ◽  
Er-Wei Shi ◽  
Zhi-Zhan Chen ◽  
Bing Xiao

1993 ◽  
pp. 37-46
Author(s):  
Yu. M. Tairov ◽  
V. F. Tsvetkov

2009 ◽  
Author(s):  
Aurélie Gentils ◽  
Marie-France Barthe ◽  
Werner Egger ◽  
Peter Sperr ◽  
Floyd D. McDaniel ◽  
...  

1997 ◽  
Vol 46 (1-3) ◽  
pp. 308-312 ◽  
Author(s):  
M. Pons ◽  
E. Blanquet ◽  
J.M. Dedulle ◽  
R. Madar ◽  
C. Bernard

1999 ◽  
Vol 572 ◽  
Author(s):  
Erwin Schmitt ◽  
Robert Eckstein ◽  
Martin Kölbl ◽  
Amd-Dietrich Weber

ABSTRACTFor the growth of 2″ 6H-SiC a sublimation growth process was developed. By different means of characterization crystal quality was evaluated. Higher defect densities, mainly in the periphery of the crystals were found to be correlated to unfavourable process conditions. Improvement of thermal boundary conditions lead to a decreased defect density and better homogeneity over the wafer area.


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