Silicon drift detector for x-ray microanalysis

2008 ◽  
Vol 106 (10) ◽  
pp. 62
Keyword(s):  
Author(s):  
W. Chen ◽  
G. A. Carini ◽  
G. De Geronimo ◽  
J. Fried ◽  
J. A. Gaskin ◽  
...  
Keyword(s):  

2014 ◽  
Vol 9 (12) ◽  
pp. C12017-C12017 ◽  
Author(s):  
J. Bufon ◽  
M. Ahangarianabhari ◽  
P. Bellutti ◽  
G. Bertuccio ◽  
S. Carrato ◽  
...  

2011 ◽  
Vol 17 (S2) ◽  
pp. 890-891
Author(s):  
B Griffin ◽  
D Joy ◽  
J Michael ◽  
J Muhling
Keyword(s):  
X Ray ◽  

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.


2014 ◽  
Vol 85 (11) ◽  
pp. 11E419 ◽  
Author(s):  
S. Purohit ◽  
Y. S. Joisa ◽  
J. V. Raval ◽  
J. Ghosh ◽  
R. Tanna ◽  
...  

2016 ◽  
Vol 22 (S3) ◽  
pp. 96-97 ◽  
Author(s):  
Chaoyi Teng ◽  
Hendrix Demers ◽  
Nicolas Brodusch ◽  
Kristian Waters ◽  
Raynald Gauvin

2008 ◽  
Vol 14 (S2) ◽  
pp. 1172-1173
Author(s):  
EA Kenik

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008


2009 ◽  
Vol 16 (2) ◽  
pp. 293-298 ◽  
Author(s):  
Edmund Welter ◽  
Karsten Hansen ◽  
Christian Reckleben ◽  
Inge Diehl

In this paper results are presented from fluorescence-yield X-ray absorption fine-structure spectroscopy measurements with a new seven-cell silicon drift detector (SDD) module. The complete module, including an integrated circuit for the detector readout, was developed and realised at DESY utilizing a monolithic seven-cell SDD. The new detector module is optimized for applications like XAFS which require an energy resolution of ∼250–300 eV (FWHM Mn Kα) at high count rates. Measurements during the commissioning phase proved the excellent performance for this type of application.


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