A fast energy-dispersive multi-element detector for X-ray absorption spectroscopy

2009 ◽  
Vol 16 (2) ◽  
pp. 293-298 ◽  
Author(s):  
Edmund Welter ◽  
Karsten Hansen ◽  
Christian Reckleben ◽  
Inge Diehl

In this paper results are presented from fluorescence-yield X-ray absorption fine-structure spectroscopy measurements with a new seven-cell silicon drift detector (SDD) module. The complete module, including an integrated circuit for the detector readout, was developed and realised at DESY utilizing a monolithic seven-cell SDD. The new detector module is optimized for applications like XAFS which require an energy resolution of ∼250–300 eV (FWHM Mn Kα) at high count rates. Measurements during the commissioning phase proved the excellent performance for this type of application.

2019 ◽  
Vol 26 (4) ◽  
pp. 1266-1271 ◽  
Author(s):  
Florian Döring ◽  
Marcel Risch ◽  
Benedikt Rösner ◽  
Martin Beye ◽  
Philipp Busse ◽  
...  

X-ray absorption spectroscopy (XAS) is a powerful element-specific technique that allows the study of structural and chemical properties of matter. Often an indirect method is used to access the X-ray absorption (XA). This work demonstrates a new XAS implementation that is based on off-axis transmission Fresnel zone plates to obtain the XA spectrum of La0.6Sr0.4MnO3 by analysis of three emission lines simultaneously at the detector, namely the O 2p–1s, Mn 3s–2p and Mn 3d–2p transitions. This scheme allows the simultaneous measurement of an integrated total fluorescence yield and the partial fluorescence yields (PFY) of the Mn 3s–2p and Mn 3d–2p transitions when scanning the Mn L-edge. In addition to this, the reduction in O fluorescence provides another measure for absorption often referred to as the inverse partial fluorescence yield (IPFY). Among these different methods to measure XA, the Mn 3s PFY and IPFY deviate the least from the true XA spectra due to the negligible influence of selection rules on the decay channel. Other advantages of this new scheme are the potential to strongly increase the efficiency and throughput compared with similar measurements using conventional gratings and to increase the signal-to-noise of the XA spectra as compared with a photodiode. The ability to record undistorted bulk XA spectra at high flux is crucial for future in situ spectroscopy experiments on complex materials.


2009 ◽  
Vol 15 (3) ◽  
pp. 295-298 ◽  
Author(s):  
K. Shinoda ◽  
S. Sato ◽  
S. Suzuki ◽  
T. Uruga ◽  
H. Tanida ◽  
...  

2014 ◽  
Vol 16 (48) ◽  
pp. 26528-26538 ◽  
Author(s):  
Charles S. Spanjers ◽  
Thomas P. Senftle ◽  
Adri C. T. van Duin ◽  
Michael J. Janik ◽  
Anatoly I. Frenkel ◽  
...  

We use differential extended X-ray absorption fine structure (Δ-EXAFS) to monitor the Ar-induced surface restructuring of silica-supported Pd nanoclusters (1 nm diameter) at 77 K.


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