Chemical force microscopy of CH3 and COOH terminal groups in mixed self-assembled monolayers by pulsed-force-mode atomic force microscopy
2000 ◽
Vol 157
(4)
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pp. 398-404
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2001 ◽
Vol 371
(1)
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pp. 151-154
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1999 ◽
Vol 1
(14)
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pp. 3345-3350
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2008 ◽
Vol 108
(10)
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pp. 1140-1143
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