Upper limits for the residual aberrations of a high-resolution aberration-corrected STEM

2000 ◽  
Vol 81 (3-4) ◽  
pp. 163-175 ◽  
Author(s):  
M. Haider ◽  
S. Uhlemann ◽  
J. Zach
2007 ◽  
Vol 13 (S02) ◽  
Author(s):  
K van Benthem ◽  
GS Painter ◽  
PF Becher ◽  
CI Contescu ◽  
NC Gallego ◽  
...  

2017 ◽  
Vol 23 (S1) ◽  
pp. 1592-1593
Author(s):  
Javier Grandal ◽  
Juan I. Beltran ◽  
Gabriel Sanchez-Santolino ◽  
Fernando Gallego ◽  
Javier Tornos ◽  
...  

2009 ◽  
Vol 15 (S2) ◽  
pp. 130-131 ◽  
Author(s):  
LF Allard ◽  
KL More ◽  
J Liu

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009


2016 ◽  
Vol 22 (S3) ◽  
pp. 1318-1319
Author(s):  
Arijita Mukherjee ◽  
Niya Sa ◽  
P J Phillips ◽  
Justin Andrews ◽  
Sarbajit Banerjee ◽  
...  

2004 ◽  
Vol 10 (S02) ◽  
pp. 260-261
Author(s):  
K. van Benthem ◽  
S. J. Pennycook

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.


2010 ◽  
Vol 110 (10) ◽  
pp. 1332-1337 ◽  
Author(s):  
Tadahiro Kawasaki ◽  
Takaomi Matsutani ◽  
Takashi Ikuta ◽  
Mikio Ichihashi ◽  
Takayoshi Tanji

2011 ◽  
Vol 17 (S2) ◽  
pp. 1286-1287
Author(s):  
W Sinkler ◽  
S Bradley ◽  
L Allard ◽  
P Voyles

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.


2007 ◽  
Vol 13 (S02) ◽  
Author(s):  
K van Benthem ◽  
S-H Oh ◽  
M Oxley ◽  
S Rashkeev ◽  
A Marinopoulos ◽  
...  

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