High Resolution EELS with the Aberration Corrected STEM: Determining Interfacial Electronic Structures with High Accuracy

2004 ◽  
Vol 10 (S02) ◽  
pp. 260-261
Author(s):  
K. van Benthem ◽  
S. J. Pennycook
Keyword(s):  
High Resolution ◽  
Electronic Structures ◽  
High Accuracy ◽  
Aberration Corrected Stem ◽  
Aberration Corrected

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

High Resolution Microscopy with Single Atom Sensitivity using Aberration-Corrected STEM

2007 ◽  
Vol 13 (S02) ◽  
Author(s):  
K van Benthem ◽  
GS Painter ◽  
PF Becher ◽  
CI Contescu ◽  
NC Gallego ◽  
...  
Keyword(s):  
High Resolution ◽  
Single Atom ◽  
Aberration Corrected Stem ◽  
High Resolution Microscopy ◽  
Aberration Corrected

scholarly journals High Resolution Studies of Oxide Multiferroic Interfaces in the Aberration-Corrected STEM

2017 ◽  
Vol 23 (S1) ◽  
pp. 1592-1593
Author(s):  
Javier Grandal ◽  
Juan I. Beltran ◽  
Gabriel Sanchez-Santolino ◽  
Fernando Gallego ◽  
Javier Tornos ◽  
...  
Keyword(s):  
High Resolution ◽  
Aberration Corrected Stem ◽  
Aberration Corrected

scholarly journals Applications of High-Resolution Aberration-Corrected STEM Imaging to Studies of the Behavior of Nanophase Materials at Elevated Temperatures

2009 ◽  
Vol 15 (S2) ◽  
pp. 130-131 ◽  
Author(s):  
LF Allard ◽  
KL More ◽  
J Liu
Keyword(s):  
High Resolution ◽  
Elevated Temperatures ◽  
Nanophase Materials ◽  
Aberration Corrected Stem ◽  
Aberration Corrected

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

scholarly journals Aberration corrected STEM and High Resolution EELS study Investigating Magnesium Intercalation in Vanadium Pentoxide Cathode

2016 ◽  
Vol 22 (S3) ◽  
pp. 1318-1319
Author(s):  
Arijita Mukherjee ◽  
Niya Sa ◽  
P J Phillips ◽  
Justin Andrews ◽  
Sarbajit Banerjee ◽  
...  
Keyword(s):  
High Resolution ◽  
Vanadium Pentoxide ◽  
Aberration Corrected Stem ◽  
Aberration Corrected

Simulation of a hollow cone-shaped probe in aberration-corrected STEM for high-resolution tomography

2010 ◽  
Vol 110 (10) ◽  
pp. 1332-1337 ◽  
Author(s):  
Tadahiro Kawasaki ◽  
Takaomi Matsutani ◽  
Takashi Ikuta ◽  
Mikio Ichihashi ◽  
Takayoshi Tanji
Keyword(s):  
High Resolution ◽  
Hollow Cone ◽  
Aberration Corrected Stem ◽  
Aberration Corrected
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