Characterisation of instrumental line shape distortions due to path difference dependent phase errors in a Fourier transform spectrometer

2000 ◽  
Vol 41 (5) ◽  
pp. 287-292 ◽  
Author(s):  
Giovanni Bianchini ◽  
Piera Raspollini
Keyword(s):  
Fourier Transform ◽  
Line Shape ◽  
Path Difference ◽  
Fourier Transform Spectrometer ◽  
Phase Errors ◽  
Instrumental Line

scholarly journals A High Resolution Fourier Transform Spectrometer for the Cassegrain Focus at the CFH Telescope

1982 ◽  
Vol 67 ◽  
pp. 213-222
Author(s):  
Jean P. Maillard ◽  
G. Michel
Keyword(s):  
Fourier Transform ◽  
High Resolution ◽  
Visible Region ◽  
Path Difference ◽  
Fourier Transform Spectrometer ◽  
Design Features

AbstractA high resolution interferometer (60cm maximum path difference) for use from the visible region to 5μm has been designed and manufactured at Meudon Observatory to be part of the instrumentation of the Canada-France-Hawaii Telescope. The considerations which led to the choice of the interferometer being operated at the Cassegrain focus, and the design features which allow this to be achieved, are outlined.

A FOURIER TRANSFORM SPECTROMETER WITHOUT BEAM SPLITTER FOR THE VUV–EUV RANGE

2002 ◽  
Vol 09 (01) ◽  
pp. 655-660 ◽  
Author(s):  
NELSON DE OLIVEIRA ◽  
DENIS JOYEUX ◽  
DANIEL PHALIPPOU ◽  
FRANCOIS POLACK
Keyword(s):  
Fourier Transform ◽  
Sampling Error ◽  
Sampling Interval ◽  
Path Difference ◽  
Fourier Transform Spectrometer ◽  
Uv Spectrum ◽  
Apparatus Function ◽  
Beam Splitters ◽  
Tilt Error ◽  
Band Spectra

We describe a Fourier transform spectrometer designed to operate down to 60 nm on a synchrotron beam line. As far as we know, there is no such instrument available in the EUV (λ < 140 nm) partly because manufacturing accurate beam splitters remains the major difficulty at these wavelengths. We use a wave front division interferometer instead of an amplitude division one to overcome this difficulty. The interferometer is based on a modified Fresnel bimirror configuration, which is controlled by an original optical system. This system keeps the mirror tilt error to a negligible value during mirror translation, and provides a sensitive interferometric measurement of the mirror translation. The sampling interval is 29 nm (path difference), allowing one to record large band spectra down to λ = 58 nm with spectral resolution δσ = 0.33 cm -1 for 512 K samples (one-sided interferograms). We measured the apparatus function by recording an interferogram from a He–Ne stabilized laser. By studying the white noise in the corresponding spectrum, we found that the sampling error in the interferogram was about 0.4 nm rms, which produces a near-perfect apparatus function. Finally, we recorded the visible/near UV spectrum of an arc mercury lamp for illustration.

Instrument line shape of infrared Fourier transform spectrometer and its engineer applications

2015 ◽  
Vol 23 (12) ◽  
pp. 3322-3328 ◽  
Author(s):  
张磊 ZHANG Lei ◽  
杨敏珠 YANG Min-zhu ◽  
邹曜璞 ZOU Yao-pu ◽  
韩昌佩 HAN Chang-pei
Keyword(s):  
Fourier Transform ◽  
Line Shape ◽  
Fourier Transform Spectrometer
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