What Do we Really See? Resolution in Near-Field Optical Microscopy

1997 ◽  
Vol 3 (S2) ◽  
pp. 1183-1184
Author(s):  
M.S. Isaacson
Keyword(s):  
Optical Microscopy ◽  
Near Field ◽  
Optical Resolution ◽  
Super Resolution ◽  
Far Field ◽  
Near Field Optics ◽  
Near Field Imaging ◽  
The Subject ◽  
Super Resolution Microscopy ◽  
Field Imaging

Six years ago there was a symposium held at the 1991 EMS A meeting to discuss the issue of “Resolution in the Microscope”.1 In this paper, we will look at resolution in near-field imaging, a blossoming field, and see whether any of our concepts have changed.It has been only within the last decade that the concept of super-resolution microscopy in the near field has been vigorously pursued and experimentally demonstrated. (For reviews on the subject, the reader is referred to the proceedings of the second and third international conferences on near field optics.) However, as in most areas of microscopy, the idea is not new, but rather rediscovered after decades of dormancy.The idea of optical resolution unhindered by far-field diffraction limitations was conceived more than a half-century ago by E.H. Synge4 in a paper entitled “A Suggested Method for Extending Microscopy Resolution into the Ultra-Microscope Regime”.

Resolution in near-field optical microscopy

1991 ◽  
Vol 49 ◽  
pp. 454-455
Author(s):  
M. Isaacson
Keyword(s):  
Optical Microscopy ◽  
Near Field ◽  
Optical Resolution ◽  
Super Resolution ◽  
Optical Probe ◽  
Basic Principles ◽  
Scanning Optical Microscopy ◽  
Super Resolution Microscopy ◽  
Near Field Scanning ◽  
Probe Source

It has only been within the last half decade that the concept of super resolution microscopy in the near-field has been vigorously pursued and experimentally demonstrated. However, the idea of optical resolution unhindered by far field diffraction limitations was conceived more than a half century ago by Synge and further elaborated by O'Keefe in the fifties. That die method was possible, however, was only first demonstrated using 3cm wavelength microwaves almost 20 years later.The basic principles of the method of near field scanning optical microscopy (NSOM) have been described before in the literature. Briefly, the idea is as follows: if an optical probe (source or detector) of diameter D is positioned within a distance of approximately D/π from the surface of an object, and the reflected, transmitted or emitted light is detected, then the lateral spatial region from which the information occurs is limited to aregion of approximate size D and not by the wavelength of the illuminated or detected light.

A 128-Pixel System-on-a-Chip for Real-Time Super-Resolution Terahertz Near-Field Imaging

2018 ◽  
Vol 53 (12) ◽  
pp. 3599-3612 ◽  
Author(s):  
Philipp Hillger ◽  
Ritesh Jain ◽  
Janusz Grzyb ◽  
Wolfgang Forster ◽  
Bernd Heinemann ◽  
...  
Keyword(s):  
Real Time ◽  
Near Field ◽  
Super Resolution ◽  
Near Field Imaging ◽  
System On A Chip ◽  
Field Imaging

scholarly journals Near-field imaging with far-field data

2016 ◽  
Vol 60 ◽  
pp. 36-42 ◽  
Author(s):  
Gang Bao ◽  
Peijun Li ◽  
Yuliang Wang
Keyword(s):  
Field Data ◽  
Near Field ◽  
Far Field ◽  
Near Field Imaging ◽  
Field Imaging

Near-Field Scanning Optical Microscopy

1987 ◽  
Vol 45 ◽  
pp. 184-187
Author(s):  
E. Betzig ◽  
M. Isaacson ◽  
A. Lewis ◽  
K. Lin
Keyword(s):  
Spatial Resolution ◽  
Structural Damage ◽  
Near Field ◽  
Far Field ◽  
Resolution Limit ◽  
Field Methods ◽  
General Applicability ◽  
Minimal Sample ◽  
Near Field Imaging ◽  
Field Imaging

The spatial resolution of most of the imaging or microcharacterization methods presently in use are fundamentally limited by the wavelength of the exciting or the emitted radiation being used. In general, the smaller the wavelength of the exciting probe, the greater the structural damage to the sample under study. Thus, the requirements of minimal sample alteration and high spatial resolution seem to be at odds with one another.However, the reason for this wavelength resolution limit is due to the far field methods for producing or detecting the radiation of interest. If one does not use far field optics, but rather the method of near field imaging, the spatial resolution attainable can be much smaller than the wavelength of the radiation used. This method of near field imaging has a general applicability for all wave probes.

High‐Resolution Near‐Field Imaging and Far‐Field Sensing Using a Transmissive Programmable Metasurface

2021 ◽  
pp. 2101067
Author(s):  
He Li ◽  
Yun Bo Li ◽  
Gang Chen ◽  
Shu Yue Dong ◽  
Jia Lin Shen ◽  
...  
Keyword(s):  
High Resolution ◽  
Near Field ◽  
Far Field ◽  
Near Field Imaging ◽  
Field Sensing ◽  
Field Imaging

Super-resolution near-field imaging on microfluidic structure

2005 ◽  
Author(s):  
Pei Wang ◽  
Lin Tang ◽  
Dou-Guo Zhang ◽  
Yong-Hua Lu ◽  
Xiao-Jin Jiao ◽  
...  
Keyword(s):  
Near Field ◽  
Super Resolution ◽  
Near Field Imaging ◽  
Field Imaging ◽  
Microfluidic Structure

scholarly journals Attaboy! Attoboys, or the new Zeptoscopists

1993 ◽  
Vol 1 (8) ◽  
pp. 2-3 ◽  
Author(s):  
Jean-Paul Revel
Keyword(s):  
Optical Microscopy ◽  
Near Field ◽  
Scanning Force Microscopy ◽  
Scanning Tunneling ◽  
Far Field ◽  
Force Microscopy ◽  
Near Field Optics ◽  
Scanning Force ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

As the year ends there is a bumper crop of announcements of advances that I find absolutely amazing. First of course is the continued clever use of light as a veritable tool in manipulating everything from atoms (entrapping them in “atomic molasses”) to having tugs of war with biological motors (using “light tweezers”). But these developments will be for discussion another time. What I want to talk about in this installment are advances in Near Field Scanning Optical Microscopy (NSOM), which has now been used by Chichester and Betzig to visualize single molecules.In classical (far field) optics, resolution is limited by diffraction to about 1/2 the wavelength of the radiation used for imaging. Near field optics overcome this limitation by use of scanning techniques similar to those employed in Scanning Tunneling or Scanning Force Microscopy.

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