Application of Multivariate Statistical Analysis to STEM X-ray Spectral Images: Interfacial Analysis in Microelectronics
2006 ◽
Vol 12
(6)
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pp. 538-544
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Keyword(s):
Data Set
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Multivariate statistical analysis methods have been applied to scanning transmission electron microscopy (STEM) energy-dispersive X-ray spectral images. The particular application of the multivariate curve resolution (MCR) technique provides a high spectral contrast view of the raw spectral image. The power of this approach is demonstrated with a microelectronics failure analysis. Specifically, an unexpected component describing a chemical contaminant was found, as well as a component consistent with a foil thickness change associated with the focused ion beam specimen preparation process. The MCR solution is compared with a conventional analysis of the same spectral image data set.
2016 ◽
Vol 2016
◽
pp. 1-11
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1997 ◽
Vol 3
(S2)
◽
pp. 931-932
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2010 ◽
Vol 285
(3)
◽
pp. 455-460
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Keyword(s):
2009 ◽
Vol 18
(6)
◽
pp. 477-488
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