Kinetic-Energy Discrimination for Atom Probe Tomography

2011 ◽  
Vol 17 (1) ◽  
pp. 1-14 ◽  
Author(s):  
Thomas F. Kelly

AbstractThe benefits of using kinetic-energy information to aid ion discrimination in atom probe tomography (APT) are explored. Ion peak interferences in time-of-flight (TOF) mass spectra are categorized by difficulty of discrimination using TOF and kinetic-energy information. Several of these categories, which are intractable interferences when only TOF information is available, may be discriminated when kinetic-energy information also is available. Furthermore, many opportunities for removing noise from composition determinations and three-dimensional images are enabled. Modest kinetic-energy resolving powers (KRPs) of 10 or so should be sufficient to have a major impact on APT. With KRP of about 100, the energy deficits in voltage pulsing may be resolved to enable peak discrimination in straight-flight-path instruments. Real examples and simulated mass spectra are used to illustrate the benefits of kinetic-energy discrimination. Many of the conclusions are applicable generally in TOF spectroscopy. Current detectors do not provide the kinetic energy of incoming ions, but there are realistic prospects for building such detectors and these are discussed. A program to develop these detectors should be pursued.

2013 ◽  
Vol 132 ◽  
pp. 60-64 ◽  
Author(s):  
L.J.S. Johnson ◽  
M. Thuvander ◽  
K. Stiller ◽  
M. Odén ◽  
L. Hultman

2011 ◽  
Vol 17 (S2) ◽  
pp. 746-747 ◽  
Author(s):  
T Kelly

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.


2008 ◽  
Vol 14 (6) ◽  
pp. 571-580 ◽  
Author(s):  
Yang Zhou ◽  
Christopher Booth-Morrison ◽  
David N. Seidman

AbstractThe effects of varying the pulse energy of a picosecond laser used in the pulsed-laser atom-probe (PLAP) tomography of an as-quenched Ni-6.5 Al-9.5 Cr at.% alloy are assessed based on the quality of the mass spectra and the compositional accuracy of the technique. Compared to pulsed-voltage atom-probe tomography, PLAP tomography improves mass resolving power, decreases noise levels, and improves compositional accuracy. Experimental evidence suggests that Ni2+, Al2+, and Cr2+ ions are formed primarily by a thermally activated evaporation process, and not by post-ionization of the ions in the 1+ charge state. An analysis of the detected noise levels reveals that for properly chosen instrument parameters, there is no significant steady-state heating of the Ni-6.5 Al-9.5 Cr at.% tips during PLAP tomography.


2018 ◽  
Vol 24 (S1) ◽  
pp. 830-831
Author(s):  
Miki Tsuchiya ◽  
Yoshihisa Orai ◽  
Takahiro Sato ◽  
Xin Man ◽  
Junichi Katane ◽  
...  

2020 ◽  
Vol 92 (7) ◽  
pp. 5168-5177 ◽  
Author(s):  
Shi Qiu ◽  
Changxi Zheng ◽  
Vivek Garg ◽  
Yu Chen ◽  
Gediminas Gervinskas ◽  
...  

2013 ◽  
Vol 24 (27) ◽  
pp. 275705 ◽  
Author(s):  
Ajay Kumar Kambham ◽  
Arul Kumar ◽  
Antonios Florakis ◽  
Wilfried Vandervorst

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