scholarly journals Automatic Diffraction Analysis and Lattice Fitting for Convergent-Beam Electron Diffraction Patterns in 4D-STEM

2021 ◽  
Vol 27 (S1) ◽  
pp. 1280-1281
Author(s):  
Sihan Wang ◽  
Tim Eldred ◽  
Jacob Smith ◽  
Wenpei Gao
Keyword(s):  
Electron Diffraction ◽  
Diffraction Analysis ◽  
Convergent Beam Electron Diffraction ◽  
Beam Electron ◽  
Diffraction Patterns ◽  
Convergent Beam

A library of convergent-beam electron diffraction patterns

1986 ◽  
Vol 44 ◽  
pp. 688-691
Author(s):  
John F. Mansfield
Keyword(s):  
Electron Diffraction ◽  
Materials Science ◽  
Convergent Beam Electron Diffraction ◽  
Beam Electron ◽  
Transmission Electron ◽  
Yield Information ◽  
Analytical Electron ◽  
Diffraction Patterns ◽  
Convergent Beam ◽  
Electron Energy Loss

One of the most important advancements of the transmission electron microscopy (TEM) in recent years has been the development of the analytical electron microscope (AEM). The microanalytical capabilities of AEMs are based on the three major techniques that have been refined in the last decade or so, namely, Convergent Beam Electron Diffraction (CBED), X-ray Energy Dispersive Spectroscopy (XEDS) and Electron Energy Loss Spectroscopy (EELS). Each of these techniques can yield information on the specimen under study that is not obtainable by any other means. However, it is when they are used in concert that they are most powerful. The application of CBED in materials science is not restricted to microanalysis. However, this is the area where it is most frequently employed. It is used specifically to the identification of the lattice-type, point and space group of phases present within a sample. The addition of chemical/elemental information from XEDS or EELS spectra to the diffraction data usually allows unique identification of a phase.

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