The symmetry of convergent-beam electron diffraction patterns from bicrystals containing a vertical grain boundary

1986 ◽  
Vol 53 (5) ◽  
pp. 717-725 ◽  
Author(s):  
F. W. Schapink ◽  
S. K. E. Forghany ◽  
R. P. Caron
Keyword(s):  
Electron Diffraction ◽  
Grain Boundary ◽  
Convergent Beam Electron Diffraction ◽  
Beam Electron ◽  
Diffraction Patterns ◽  
Convergent Beam

A library of convergent-beam electron diffraction patterns

1986 ◽  
Vol 44 ◽  
pp. 688-691
Author(s):  
John F. Mansfield
Keyword(s):  
Electron Diffraction ◽  
Materials Science ◽  
Convergent Beam Electron Diffraction ◽  
Beam Electron ◽  
Transmission Electron ◽  
Yield Information ◽  
Analytical Electron ◽  
Diffraction Patterns ◽  
Convergent Beam ◽  
Electron Energy Loss

One of the most important advancements of the transmission electron microscopy (TEM) in recent years has been the development of the analytical electron microscope (AEM). The microanalytical capabilities of AEMs are based on the three major techniques that have been refined in the last decade or so, namely, Convergent Beam Electron Diffraction (CBED), X-ray Energy Dispersive Spectroscopy (XEDS) and Electron Energy Loss Spectroscopy (EELS). Each of these techniques can yield information on the specimen under study that is not obtainable by any other means. However, it is when they are used in concert that they are most powerful. The application of CBED in materials science is not restricted to microanalysis. However, this is the area where it is most frequently employed. It is used specifically to the identification of the lattice-type, point and space group of phases present within a sample. The addition of chemical/elemental information from XEDS or EELS spectra to the diffraction data usually allows unique identification of a phase.

Evaluation of accuracy in the determination of crystal structure factors using large-angle convergent-beam electron diffraction patterns

Microscopy ◽  
2020 ◽  
Author(s):  
Daisuke Morikawa ◽  
Kenji Tsuda
Keyword(s):  
Electron Diffraction ◽  
Density Distribution ◽  
Electron Density ◽  
Electron Density Distribution ◽  
Large Angle ◽  
Convergent Beam Electron Diffraction ◽  
Beam Electron ◽  
Diffraction Patterns ◽  
Convergent Beam ◽  
Ordered State

Abstract The accuracy of electron density distribution analysis using large-angle convergent-beam electron diffraction (LACBED) patterns is evaluated for different convergence angles. An orbital ordered state of FeCr2O4 is used as an example of the analysis. Ideal orbital-ordered and non-ordered states are simulated by using orbital scattering factors. LACBED patterns calculated for the orbital-ordered state were used as hypothetical experimental data sets. Electron density distribution of the Fe 3d orbitals has been successfully reconstructed with a higher accuracy from LACBED patterns with convergence angles larger than 15.2 mrad, which is 4 times as large as that for conventional convergent-beam electron diffraction patterns. Excitation of particular Bloch waves with the aid of LACBED patterns has a key role in the accurate analysis of electron density distributions.

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