4D Shearforce-Based Constant-Distance Mode Scanning Electrochemical Microscopy

Analytical Chemistry ◽

10.1021/ac1008805 ◽

2010 ◽

Vol 82 (18) ◽

pp. 7842-7848 ◽

Author(s):

Michaela Nebel ◽

Kathrin Eckhard ◽

Thomas Erichsen ◽

Albert Schulte ◽

Wolfgang Schuhmann

Keyword(s):

Scanning Electrochemical Microscopy ◽

Constant Distance ◽

Electrochemical Microscopy

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Novel strategy for constant-distance imaging using alternating current scanning electrochemical microscopy

Electrochemistry Communications ◽

10.1016/j.elecom.2007.08.010 ◽

2007 ◽

Vol 9 (10) ◽

pp. 2617-2621 ◽

Author(s):

Piotr M. Diakowski ◽

Zhifeng Ding

Keyword(s):

Scanning Electrochemical Microscopy ◽

Alternating Current ◽

Constant Distance ◽

Novel Strategy ◽

Electrochemical Microscopy

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Deconvoluting Topography and Spatial Physiological Activity of Live Macrophage Cells by Scanning Electrochemical Microscopy in Constant-Distance Mode

Analytical Chemistry ◽

10.1021/ac101524v ◽

2010 ◽

Vol 82 (20) ◽

pp. 8371-8373 ◽

Author(s):

Xiaocui Zhao ◽

Piotr M. Diakowski ◽

Zhifeng Ding

Keyword(s):

Physiological Activity ◽

Scanning Electrochemical Microscopy ◽

Macrophage Cells ◽

Constant Distance ◽

Electrochemical Microscopy

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Ring-disk microelectrodes for simultaneous constant-distance and constant-current mode scanning electrochemical microscopy

Electrochemistry Communications ◽

10.1016/j.elecom.2012.11.028 ◽

2013 ◽

Vol 27 ◽

pp. 160-163 ◽

Author(s):

Michaela Nebel ◽

Sebastian Neugebauer ◽

Kathrin Eckhard ◽

Wolfgang Schuhmann

Keyword(s):

Scanning Electrochemical Microscopy ◽

Current Mode ◽

Constant Current ◽

Constant Distance ◽

Constant Current Mode ◽

Electrochemical Microscopy

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Feedback-Independent Pt Nanoelectrodes for Shear Force-Based Constant-Distance Mode Scanning Electrochemical Microscopy

Analytical Chemistry ◽

10.1021/ac061310o ◽

2006 ◽

Vol 78 (20) ◽

pp. 7317-7324 ◽

Author(s):

Mathieu Etienne ◽

Emily C. Anderson ◽

Stephanie R. Evans ◽

Wolfgang Schuhmann ◽

Ingrid Fritsch

Keyword(s):

Shear Force ◽

Scanning Electrochemical Microscopy ◽

Constant Distance ◽

Electrochemical Microscopy

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Corrosion of NiTi Shape-Memory Alloys: Visualization by Means of Potentiometric ''Constant-Distance'' Scanning Electrochemical Microscopy

Materials Science Forum ◽

10.4028/www.scientific.net/msf.394-395.145 ◽

2002 ◽

Vol 394-395 ◽

pp. 145-148 ◽

Author(s):

Albert Schulte ◽

Sascha Belger ◽

Wolfgang Schuhmann

Keyword(s):

Shape Memory Alloys ◽

Shape Memory ◽

Scanning Electrochemical Microscopy ◽

Constant Distance ◽

Niti Shape Memory Alloys ◽

Electrochemical Microscopy

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Improved Resolution of Local Metal Deposition by Means of Constant Distance Mode Scanning Electrochemical Microscopy

Electroanalysis ◽

10.1002/elan.200403179 ◽

2005 ◽

Vol 17 (5-6) ◽

pp. 538-542 ◽

Author(s):

Iva Turyan ◽

Mathieu Etienne ◽

Daniel Mandler ◽

Wolfgang Schuhmann

Keyword(s):

Scanning Electrochemical Microscopy ◽

Metal Deposition ◽

Constant Distance ◽

Electrochemical Microscopy

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High resolution constant-distance mode alternating current scanning electrochemical microscopy (AC-SECM)

Electrochemistry Communications ◽

10.1016/j.elecom.2004.01.006 ◽

2004 ◽

Vol 6 (3) ◽

pp. 288-293 ◽

Author(s):

Mathieu Etienne ◽

Albert Schulte ◽

Wolfgang Schuhmann

Keyword(s):

High Resolution ◽

Scanning Electrochemical Microscopy ◽

Alternating Current ◽

Constant Distance ◽

Electrochemical Microscopy

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Facilitated Tip-Positioning and Applications of Non-Electrode Tips in Scanning Electrochemical Microscopy Using a Shear Force Based Constant-Distance Mode

Chemistry - A European Journal ◽

10.1002/(sici)1521-3765(20000502)6:9<1547::aid-chem1547>3.0.co;2-c ◽

2000 ◽

Vol 6 (9) ◽

pp. 1547-1554 ◽

Author(s):

Andreas Hengstenberg ◽

Christine Kranz ◽

Wolfgang Schuhmann

Keyword(s):

Shear Force ◽

Scanning Electrochemical Microscopy ◽

Constant Distance ◽

Electrochemical Microscopy

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Constant-Distance Mode Scanning Electrochemical Microscopy (SECM)—Part I: Adaptation of a Non-Optical Shear-Force-Based Positioning Mode for SECM Tips

Chemistry - A European Journal ◽

10.1002/chem.200204267 ◽

2003 ◽

Vol 9 (9) ◽

pp. 2025-2033 ◽

Author(s):

Bernardo Ballesteros Katemann ◽

Albert Schulte ◽

Wolfgang Schuhmann

Keyword(s):

Shear Force ◽

Scanning Electrochemical Microscopy ◽

Constant Distance ◽

Electrochemical Microscopy

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Facilitated Tip-Positioning and Applications of Non-Electrode Tips in Scanning Electrochemical Microscopy Using a Shear Force Based Constant-Distance Mode

Chemistry - A European Journal ◽

10.1002/(sici)1521-3765(20000502)6:9<1547::aid-chem1547>3.3.co;2-3 ◽

2000 ◽

Vol 6 (9) ◽

pp. 1547-1554 ◽

Author(s):

Andreas Hengstenberg ◽

Christine Kranz ◽

Wolfgang Schuhmann

Keyword(s):

Shear Force ◽

Scanning Electrochemical Microscopy ◽

Constant Distance ◽

Electrochemical Microscopy

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