TOF-SIMS with Argon Gas Cluster Ion Beams: A Comparison with C60+

2011 ◽  
Vol 83 (10) ◽  
pp. 3793-3800 ◽  
Author(s):  
Sadia Rabbani ◽  
Andrew M. Barber ◽  
John S. Fletcher ◽  
Nicholas P. Lockyer ◽  
John C. Vickerman
2016 ◽  
Vol 11 (2) ◽  
pp. 02A321 ◽  
Author(s):  
Hyun Kyong Shon ◽  
Sohee Yoon ◽  
Jeong Hee Moon ◽  
Tae Geol Lee

2012 ◽  
Vol 116 (44) ◽  
pp. 23735-23741 ◽  
Author(s):  
Li Yang ◽  
Martin P. Seah ◽  
Ian S. Gilmore

2015 ◽  
Vol 119 (27) ◽  
pp. 15316-15324 ◽  
Author(s):  
Kan Shen ◽  
Andreas Wucher ◽  
Nicholas Winograd

2014 ◽  
Vol 46 (S1) ◽  
pp. 189-192 ◽  
Author(s):  
Hyun Kyong Shon ◽  
Young-Lai Cho ◽  
Choung Su Lim ◽  
Joon Sig Choi ◽  
Sang J. Chung ◽  
...  

2021 ◽  
Vol 5 (2) ◽  
pp. 10
Author(s):  
Kousuke Moritani ◽  
Shogo Nagata ◽  
Atsushi Tanaka ◽  
Kosuke Goto ◽  
Norio Inui

Since molecular cluster ion beams are expected to have various chemical effects, they are promising candidates for improving the secondary ion yield of Tof-SIMS. However, in order to clarify the effect and its mechanism, it is necessary to generate molecular cluster ion beams with various chemical properties and systematically examine it. In this study, we have established a method to stably form various molecular cluster ion beams from relatively small amounts of liquid materials for a long time by the bubbling method. Furthermore, we applied the cluster ion beams of water, methanol, methane, and benzene to the primary beam of SIMS and compared the molecular ion yields of aspartic acid. The effect of enhancing the yields of [M+H]+ ion of aspartic acid was found to be the largest for the water cluster and small for the methane and benzene clusters. These results indicate that the chemical effect contributes to the desorption/ionization process of organic molecules by the molecular cluster ion beam.


2010 ◽  
Vol 42 (9) ◽  
pp. 1453-1457 ◽  
Author(s):  
Takuya Miyayama ◽  
Noriaki Sanada ◽  
Scott R. Bryan ◽  
John S. Hammond ◽  
Mineharu Suzuki

2013 ◽  
Vol 45 (13) ◽  
pp. 1859-1868 ◽  
Author(s):  
Peter J. Cumpson ◽  
Jose F. Portoles ◽  
Anders J. Barlow ◽  
Naoko Sano ◽  
Mark Birch

2004 ◽  
Vol 231-232 ◽  
pp. 159-163 ◽  
Author(s):  
J. Xu ◽  
S. Ostrowski ◽  
C. Szakal ◽  
A.G. Ewing ◽  
N. Winograd

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