molecular depth profiling
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Gas Cluster Ion Beams for Secondary Ion Mass Spectrometry

2018 ◽  
Vol 11 (1) ◽  
pp. 29-48 ◽  
Author(s):  
Nicholas Winograd
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Depth Profiling ◽  
Ion Beams ◽  
High Yield ◽  
Ion Mass Spectrometry ◽  
Molecular Depth Profiling ◽  
Cluster Ion Beams ◽  
Cluster Ion ◽  
Secondary Ion

Gas cluster ion beams (GCIBs) provide new opportunities for bioimaging and molecular depth profiling with secondary ion mass spectrometry (SIMS). These beams, consisting of clusters containing thousands of particles, initiate desorption of target molecules with high yield and minimal fragmentation. This review emphasizes the unique opportunities for implementing these sources, especially for bioimaging applications. Theoretical aspects of the cluster ion/solid interaction are developed to maximize conditions for successful mass spectrometry. In addition, the history of how GCIBs have become practical laboratory tools is reviewed. Special emphasis is placed on the versatility of these sources, as size, kinetic energy, and chemical composition can be varied easily to maximize lateral resolution, hopefully to less than 1 micron, and to maximize ionization efficiency. Recent examples of bioimaging applications are also presented.

scholarly journals Molecular depth profiling on rat brain tissue sections prepared using different sampling methods

2018 ◽  
Vol 13 (3) ◽  
pp. 03B411 ◽  
Author(s):  
Hyun Kyong Shon ◽  
Shin Hye Kim ◽  
Sohee Yoon ◽  
Chan Young Shin ◽  
Tae Geol Lee
Keyword(s):  
Rat Brain ◽  
Brain Tissue ◽  
Sampling Methods ◽  
Depth Profiling ◽  
Tissue Sections ◽  
Molecular Depth Profiling ◽  
Rat Brain Tissue

Nitric oxide assisted C60secondary ion mass spectrometry for molecular depth profiling of polyelectrolyte multilayers

2015 ◽  
Vol 29 (23) ◽  
pp. 2204-2210 ◽  
Author(s):  
G. Zappalà ◽  
V. Motta ◽  
N. Tuccitto ◽  
S. Vitale ◽  
A. Torrisi ◽  
...  
Keyword(s):  
Nitric Oxide ◽  
Mass Spectrometry ◽  
Depth Profiling ◽  
Polyelectrolyte Multilayers ◽  
Ion Mass Spectrometry ◽  
Molecular Depth Profiling

Molecular Depth Profiling with Argon Gas Cluster Ion Beams

2015 ◽  
Vol 119 (27) ◽  
pp. 15316-15324 ◽  
Author(s):  
Kan Shen ◽  
Andreas Wucher ◽  
Nicholas Winograd
Keyword(s):  
Depth Profiling ◽  
Ion Beams ◽  
Argon Gas ◽  
Molecular Depth Profiling ◽  
Cluster Ion Beams ◽  
Cluster Ion

Surface Analysis and Ultra-Shallow Molecular Depth-Profiling of Polyethylene Treated by an Atmospheric Ar-D2O Post-Discharge

2015 ◽  
Vol 12 (9) ◽  
pp. 919-925 ◽  
Author(s):  
Vanina Cristaudo ◽  
Stéphanie Collette ◽  
Claude Poleunis ◽  
François Reniers ◽  
Arnaud Delcorte
Keyword(s):  
Surface Analysis ◽  
Depth Profiling ◽  
Post Discharge ◽  
Molecular Depth Profiling

Comparison of fullerene and large argon clusters for the molecular depth profiling of amino acid multilayers

2013 ◽  
Vol 406 (1) ◽  
pp. 201-211 ◽  
Author(s):  
N. Wehbe ◽  
T. Mouhib ◽  
A. Delcorte ◽  
P. Bertrand ◽  
R. Moellers ◽  
...  
Keyword(s):  
Amino Acid ◽  
Depth Profiling ◽  
Argon Clusters ◽  
Molecular Depth Profiling

scholarly journals 3-D Molecular Depth Profiling of Biological and Polymeric Materials Using Time-of-Flight Secondary Ion Mass Spectrometry

2013 ◽  
Vol 19 (S2) ◽  
pp. 664-665
Author(s):  
P.A. Clark ◽  
E. Tallarek ◽  
D. Breitenstein ◽  
B. Hagenhoff ◽  
N. Havercroft
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Time Of Flight ◽  
Depth Profiling ◽  
Polymeric Materials ◽  
Ion Mass Spectrometry ◽  
Molecular Depth Profiling ◽  
Secondary Ion

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Molecular Depth Profiling with Cluster Ion Beams

2013 ◽  
pp. 117-205 ◽  
Author(s):  
Christine M. Mahoney ◽  
Andreas Wucher
Keyword(s):  
Depth Profiling ◽  
Ion Beams ◽  
Molecular Depth Profiling ◽  
Cluster Ion Beams ◽  
Cluster Ion

Molecular depth profiling of organic photovoltaic heterojunction layers by ToF-SIMS: comparative evaluation of three sputtering beams

The Analyst ◽  
2013 ◽  
Vol 138 (22) ◽  
pp. 6801 ◽  
Author(s):  
T. Mouhib ◽  
C. Poleunis ◽  
N. Wehbe ◽  
J. J. Michels ◽  
Y. Galagan ◽  
...  
Keyword(s):  
Comparative Evaluation ◽  
Depth Profiling ◽  
Organic Photovoltaic ◽  
Tof Sims ◽  
Molecular Depth Profiling

Ambient Low Temperature Plasma Etching of Polymer Films for Secondary Ion Mass Spectrometry Molecular Depth Profiling

2012 ◽  
Vol 84 (24) ◽  
pp. 10763-10767 ◽  
Author(s):  
Shin Muramoto ◽  
Matthew E. Staymates ◽  
Tim M. Brewer ◽  
Greg Gillen
Keyword(s):  
Mass Spectrometry ◽  
Low Temperature ◽  
Plasma Etching ◽  
Polymer Films ◽  
Secondary Ion Mass Spectrometry ◽  
Depth Profiling ◽  
Low Temperature Plasma ◽  
Temperature Plasma ◽  
Molecular Depth Profiling ◽  
Secondary Ion
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