Interdiffusion at Homopolymer/Random Copolymer Interfaces Investigated by Energy-Filtering Transmission Electron Microscopy

2007 ◽  
Vol 40 (22) ◽  
pp. 7966-7972 ◽  
Author(s):  
Yonggui Liao ◽  
Ayumi Nakagawa ◽  
Shin Horiuchi ◽  
Toshiaki Ougizawa
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Random Copolymer ◽  
Energy Filtering ◽  
Transmission Electron

The use of an energy-filtering electron microscope to reduce chromatic aberration in images of thick biological specimens

1986 ◽  
Vol 44 ◽  
pp. 88-91
Author(s):  
L. D. Peachey ◽  
J. P. Heath ◽  
G. Lamprecht
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Beam ◽  
Cross Section ◽  
Electron Scattering ◽  
Chromatic Aberration ◽  
Image Resolution ◽  
Incident Electron Energy ◽  
Energy Filtering ◽  
Transmission Electron

Biological specimens of cells and tissues generally are considerably thicker than ideal for high resolution transmission electron microscopy. Actual image resolution achieved is limited by chromatic aberration in the image forming electron lenses combined with significant energy loss in the electron beam due to inelastic scattering in the specimen. Increased accelerating voltages (HVEM, IVEM) have been used to reduce the adverse effects of chromatic aberration by decreasing the electron scattering cross-section of the elements in the specimen and by increasing the incident electron energy.

scholarly journals Development of a New Acquisition Scheme for Energy-Filtering Transmission Electron Microscopy Spectrum-Imaging toward Quantification

2011 ◽  
Vol 17 (S2) ◽  
pp. 790-791
Author(s):  
M Watanabe ◽  
F Allen
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Energy Filtering ◽  
Transmission Electron ◽  
Acquisition Scheme ◽  
Spectrum Imaging

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Energy filtering transmission electron microscopy using the new JEM-2010FEF

1999 ◽  
Vol 194 (1) ◽  
pp. 210-218 ◽  
Author(s):  
TOMOKIYO ◽  
MATSUMURA ◽  
MANABE
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Energy Filtering ◽  
Transmission Electron

scholarly journals Analysis of Metal/Plastic Interfaces by Energy-Filtering Transmission Electron Microscopy

2012 ◽  
Vol 48 (9) ◽  
pp. 322-330 ◽  
Author(s):  
Shin HORIUTI ◽  
Takeshi HANADA ◽  
Takayuki MIYAMAE ◽  
Tadae YAMANAKA ◽  
Kogoro OOSUMI ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Energy Filtering ◽  
Transmission Electron

Application of energy-filtering transmission electron microscopy to characterize amorphous boron nanowires

2002 ◽  
Vol 244 (1) ◽  
pp. 123-128 ◽  
Author(s):  
Y.Q. Wang ◽  
X.F. Duan ◽  
L.M. Cao ◽  
G. Li ◽  
W.K. Wang
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Amorphous Boron ◽  
Energy Filtering ◽  
Transmission Electron ◽  
Boron Nanowires
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