Quantitative high resolution transmission electron microscopy: the need for energy filtering and the advantages of energy-loss imaging

1988 ◽  
Vol 151 (2) ◽  
pp. 171-184 ◽  
Author(s):  
W. M. Stobbs ◽  
W. O. Saxton
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Energy Loss ◽  
Energy Filtering ◽  
Transmission Electron

Electron Energy-Loss Spectroscopy (EELS) of Fe-Bearing Olivine and Laihunite (an Oxidized Olivine)

2000 ◽  
Vol 6 (S2) ◽  
pp. 208-209
Author(s):  
Huifang Xu ◽  
Pingqiu Fu
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Energy Loss ◽  
Electron Energy ◽  
Electron Energy Loss Spectroscopy ◽  
Structure Refinement ◽  
Iron Formation ◽  
Transmission Electron ◽  
Electron Energy Loss

Laihunite that has distorted olivine-type structure with ferric and ferrous irons and ordered distribution of vacancies was first discovered in a high-grade metamorphosed banded iron formation (BIF) [1, 2]. The laihunite coexisting with fayalite (Fe-olivine), magnetite, quartz, ferrosilite, garnet and hedenbergite, formed in the process of oxidation of fayalite [2, 3]. The structure refinement of 1-layer laihunite shows P21/b symmetry and ordered distribution of vacancies in half M1 sites of olivine structure [2, 3]. Early high-resolution transmission electron microscopy (HRTEM) study and HRTEM image simulation of the 1-layer laihunite verified the structure refinement [4].Specimens of weakly oxidized fayalite and laihunite containing fayalite islands collected from Xiaolaihe and Menjiagou of Liaoning Province, NE China, have been studied using selected area electron diffraction (SAED), high-resolution transmission electron microscopy (HRTEM), electron energy-loss spectroscopy (EELS), and X-ray energy-dispersive spectroscopy.

Energy-filtering Transmission Electron Microscopy in materials and life science

1994 ◽  
Vol 52 ◽  
pp. 936-937
Author(s):  
L. Reimer
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Energy Loss ◽  
Electron Energy ◽  
Analytical Electron Microscopy ◽  
Edge Structure ◽  
Energy Filtering ◽  
Transmission Electron ◽  
Plasmon Loss ◽  
Electron Energy Loss

Energy-filtering transmission electron microscopy can be realized by an imaging filter lens in thecolumn of a TEM, a post-column electron energy-loss spectrometer or a dedicated STEM. This offers new possibilities in analytical electron microscopy by combining the operation modes of electron-spectroscopic imaging (ESI), electron-spectroscopic diffraction (ESD) and the record of an electron energy-loss spectrum (EELS).ESI can be used in the zero-loss mode to remove all inelastically scattered electrons. Thicker amorphous and crystalline specimens can be observed without chromatic aberration and with a transmissionof 10−3 up to 80(110) and 150(200) μg/cm2 at 80(120) keV, respectively. This results in a condiserable increase of scattering, phase and Bragg contrast, especially for low Z material because the ratio of inelastic-to-elastic cross section increases as 20/Z with decreasing atomic number. In future energy-filtered high-resolution crystal-lattice images will offer us a better comparison with dynamical simulations. Plasmon loss filtering can be applied for a better separation of phases (e.g. precipitates in a matrix), which differ in their plasmon loss by about 1 eV. Owing to intersections of the energy loss spectra, different parts of a specimen can change their contrast when tuning the selected energy window. Structures containing non carbon atoms will beconsiderably increased in a bright field like contrast relative to the carboneous matrix just below the carbon K edge (structure—sensitive imaging).

Site-specific cross-sectioning of carbon nanotube-to-metal junctions for high spatial resolution chemical and structural analysis

2002 ◽  
Vol 738 ◽  
Author(s):  
K. Dovidenko ◽  
N. L. Abramson ◽  
J. Rullan
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Carbon Nanotube ◽  
High Resolution ◽  
Energy Loss ◽  
Electron Energy ◽  
Electron Energy Loss Spectroscopy ◽  
Site Specific ◽  
Transmission Electron ◽  
Electron Energy Loss

ABSTRACTIn this study, we have demonstrated successful site-specific cross-sectioning of carbon-nanotube - metal junctions which provided samples suitable for high resolution transmission electron microscopy and electron energy loss spectroscopy. For the cross-sectioning, we have suggested a modified technique based on combination of the Focused Ion Beam (FIB) lift-out and the conventional Ar+ ion milling techniques. Electron-transparent cross-sections of multiwall carbon nanotubes showing no significant surface amorphization or Ga contamination (typical artifacts of conventional FIB lift-out technique) were obtained. High-resolution transmission electron microscopy and electron energy loss spectroscopy of a multi-wall carbon nanotube cross-section have been carried out.

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