Millimetre-wave response of InGaAsP lasers

1985 ◽  
Vol 21 (25-26) ◽  
pp. 1195 ◽  
Author(s):  
J.E. Bowers
1997 ◽  
Vol 85 (1-3) ◽  
pp. 1501-1502 ◽  
Author(s):  
A. Ardavan ◽  
J. Singleton ◽  
W. Hayes ◽  
A. Polisski ◽  
P. Goy ◽  
...  

2003 ◽  
Vol 137 (1-3) ◽  
pp. 1225-1226 ◽  
Author(s):  
A. Narduzzo ◽  
A. Ardavan ◽  
A.I. Coldea ◽  
J. Singleton ◽  
A. Akutsu-Sato ◽  
...  

1999 ◽  
Vol 103 (1-3) ◽  
pp. 1947-1948
Author(s):  
J.M. Schrama ◽  
A. Ardavan ◽  
J. Singleton ◽  
S.J. Blumdell ◽  
W. Hayes ◽  
...  

1997 ◽  
Vol 90 (3) ◽  
pp. 495-497
Author(s):  
CLAUDIO ESPOSTI ◽  
FILIPPO TAMASSIA ◽  
CRISTINA PUZZARINI ◽  
RICCARDO TARRONI ◽  
ZDENEK ZELINGER

1997 ◽  
Vol 92 (2) ◽  
pp. 229-236 ◽  
Author(s):  
M. HEPP ◽  
R. GENDRIESCH ◽  
I. PAK ◽  
Y.A. KURITSYN ◽  
F. LEWEN ◽  
...  

1989 ◽  
Vol 136 (6) ◽  
pp. 487
Author(s):  
S.T. Peng ◽  
S.J. Xu ◽  
F.K. Schwering
Keyword(s):  

2003 ◽  
Vol 783 ◽  
Author(s):  
Charles E Free

This paper discusses the techniques that are available for characterising circuit materials at microwave and millimetre wave frequencies. In particular, the paper focuses on a new technique for measuring the loss tangent of substrates at mm-wave frequencies using a circular resonant cavity. The benefits of the new technique are that it is simple, low cost, capable of good accuracy and has the potential to work at high mm-wave frequencies.


Sign in / Sign up

Export Citation Format

Share Document