Transmission‐type negative group delay networks using coupled line doublet structure

2015 ◽  
Vol 9 (8) ◽  
pp. 748-754 ◽  
Author(s):  
Girdhari Chaudhary ◽  
Yongchae Jeong
2020 ◽  
Vol 20 (1) ◽  
pp. 73-79
Author(s):  
Girdhari Chaudhary ◽  
Yongchae Jeong

This paper presents a design of a transmissive-type, low insertion loss (IL) negative group delay (NGD) circuit with a reconfigurable NGD. The proposed circuit consists of a series transmission lines (TLs) and shunt short-circuited coupled lines where an isolation port is terminated with a parasitic compensated PIN diode. Analytical design equations are derived to obtain the circuit parameters for the predefined NGD and IL. The low IL can be achieved because of the very high characteristic impedance of the short-circuited coupled lines. The TL terminated with a PIN diode is used to achieve the constant center frequency of reconfigurable NGD circuit. For experimental validation, the NGD circuit is designed and fabricated at a center frequency (<i>f</i><sub>0</sub>) of 2.14 GHz. In the measurement, the NGD varies from -0.5 ns to -2 ns with an IL variation of 2.08 to 3.60 dB at <i>f</i><sub>0</sub> = 2.14 GHz. The NGD bandwidth (bandwidth of GD less than 0 ns) varies from 90 MHz to 50 MHz. The minimum input/output return losses are higher than 10 dB for the overall tuning range.


Author(s):  
Blaise Ravelo ◽  
Sebastien Lallechere ◽  
Wenceslas Rahajandraibe ◽  
Fayu Wan

IEEE Access ◽  
2020 ◽  
Vol 8 ◽  
pp. 47596-47606
Author(s):  
Blaise Ravelo ◽  
Lili Wu ◽  
Fayu Wan ◽  
Wenceslas Rahajandraibe ◽  
Nour Mohammad Murad

2014 ◽  
Vol 22 (23) ◽  
pp. 29213 ◽  
Author(s):  
Antonio Gellineau ◽  
Yu-Po Wong ◽  
Olav Solgaard

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