scholarly journals Microscopy of defects in semiconductors

Author(s):  
Fabien C.-P Massabuau ◽  
Jochen Bruckbauer ◽  
Carol Trager-Cowan ◽  
Rachel A. Oliver



1998 ◽  
Vol 58 (3) ◽  
pp. 1318-1325 ◽  
Author(s):  
M. J. Puska ◽  
S. Pöykkö ◽  
M. Pesola ◽  
R. M. Nieminen


1993 ◽  
Vol 28 (1) ◽  
pp. K8-K9
Author(s):  
H. Alexander






Sign in / Sign up

Export Citation Format

Share Document