Point and Extended Defects in Semiconductors - NATO ASI Series
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9781468457117, 9781468457094
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Internal Friction Due to Defects in Semiconductors

1989 ◽  
pp. 65-75
Author(s):  
P. Haasen ◽  
U. Jendrich ◽  
D. Laszig
Keyword(s):  
Internal Friction ◽  
Defects In Semiconductors

Interaction between Point-Defects, Dislocations and a Grain Boundary: A HREM Study

1989 ◽  
pp. 153-164 ◽  
Author(s):  
J. Thibault-Desseaux ◽  
J. L. Putaux ◽  
H. O. K. Kirchner
Keyword(s):  
Grain Boundary ◽  
Point Defects

Point Defects in GaAs

1989 ◽  
pp. 39-50
Author(s):  
E. R. Weber ◽  
K. Khachaturyan ◽  
M. Hoinkis ◽  
M. Kaminska
Keyword(s):  
Point Defects

Recombination at Dislocations in Silicon and Gallium Arsenide

1989 ◽  
pp. 243-256 ◽  
Author(s):  
P. R. Wilshaw ◽  
T. S. Fell ◽  
G. R. Booker
Keyword(s):  
Gallium Arsenide

Tunneling Spectroscopy and III-V Semiconductor Interfaces

1989 ◽  
pp. 201-205
Author(s):  
O. Albrektsen ◽  
H. W. M. Salemink
Keyword(s):  
Tunneling Spectroscopy ◽  
Semiconductor Interfaces
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